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Manus, M. K. M., Kash, J. A., Steen, S. E., Polonsky, S., Tsang, J. C., Knebel, D. R., et al. (2000). PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability, 40, 1353–1358.
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Seki, T., Shibata, H., Takesue, H., Tokura, Y., & Imoto, N. (2010). Comparison of timing jitter between NbN superconducting single-photon detector and avalanche photodiode. Phys. C, 470(20), 1534–1537.
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Ferrari, S., Kovalyuk, V., Hartmann, W., Vetter, A., Kahl, O., Lee, C., et al. (2017). Hot-spot relaxation time current dependence in niobium nitride waveguide-integrated superconducting nanowire single-photon detectors. Opt. Express, 25(8), 8739–8750.
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Минаева, О. В. (2009). Быстродействующий однофотонный детектор на основе тонкой сверхпроводниковой пленки NbN. Ph.D. thesis, , .
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Stucki, D., Barreiro, C., Fasel, S., Gautier, J. - D., Gay, O., Gisin, N., et al. (2009). Continuous high speed coherent one-way quantum key distribution. Opt. Express, 17(16), 13326–13334.
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