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Gol’tsman, G. N., & Gershenzon, E. M. (1999). Phonon-cooled hot-electron bolometric mixer: overview of recent results. Appl. Supercond., 6(10-12), 649–655.
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Hübers, H. - W., Schubert, J., Krabbe, A., Birk, M., Wagner, G., Semenov, A., et al. (2001). Parylene anti-reflection coating of a quasi-optical hot-electron-bolometric mixer at terahertz frequencies. Infrared Physics & Technology, 42(1), 41–47.
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Gol'tsman, G. N. (1999). Hot electron bolometric mixers: new terahertz technology. Infrared Physics & Technology, 40(3), 199–206.
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Zhang, W., Miao, W., Yao, Q. J., Lin, Z. H., Shi, S. C., Gao, J. R., et al. (2012). Spectral response and noise temperature of a 2.5 THz spiral antenna coupled NbN HEB mixer. Phys. Procedia, 36, 334–337.
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Korneev, A., Korneeva, Y., Florya, I., Voronov, B., & Goltsman, G. (2012). NbN nanowire superconducting single-photon detector for mid-infrared. Phys. Procedia, 36, 72–76.
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Emelianov, A. V., Nekrasov, N. P., Moskotin, M. V., Fedorov, G. E., Otero, N., Romero, P. M., et al. (2021). Individual SWCNT transistor with photosensitive planar junction induced by two‐photon oxidation. Adv. Electron. Mater., 7(3), 2000872.
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Tretyakov, I., Shurakov, A., Perepelitsa, A., Kaurova, N., Svyatodukh, S., Zilberley, T., et al. (2019). Room temperature silicon detector for IR range coated with Ag2S quantum dots. Phys. Status Solidi RRL, 13(9), 1900187–(1–6).
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Vakhtomin, Y. B., Finkel, M. I., Antipov, S. V., Smirnov, K. V., Kaurova, N. S., Drakinskii, V. N., et al. (2003). The gain bandwidth of mixers based on the electron heating effect in an ultrathin NbN film on a Si substrate with a buffer MgO layer. J. of communications technol. & electronics, 48(6), 671–675.
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Boyarskii, D. A., Gershenzon, V. E., Gershenzon, E. M., Gol'tsman, G. N., Ptitsina, N. G., Tikhonov, V. V., et al. (1996). On the possibility of determining the microstructural parameters of an oil-bearing layer from radiophysical measurement data. J. of Communications Technology and Electronics, 41(5), 408–414.
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Gershenson, E. M., Gol'tsman, G. N., Elant'ev, A. I., Kagane, M. L., Multanovskii, V. V., & Ptitsina, N. G. (1983). Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. Sov. Phys. Semicond., 17(8), 908–913.
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