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Author |
Title |
Year |
Publication |
Volume |
Pages |
Links  |
|
|
Смирнов, Константин Владимирович |
Энергетическая релаксация электронов в 2D-канале гетеропереходов GAAS/ALGAAS и транспортные процессы в структурах полупроводник-сверхпроводник на их основе |
2000 |
М. МПГУ |
|
|
|
|
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Smirnov, K. V.; Ptitsina, N. G.; Vakhtomin, Y. B.; Verevkin, A. A.; Gol’tsman, G. N.; Gershenzon, E. M. |
Energy relaxation of two-dimensional electrons in the quantum Hall effect regime |
2000 |
JETP Lett. |
71 |
31-34 |
|
|
|
Kawamura, J.; Blundell, R.; Tong, C.-Y. E.; Papa, D. C.; Hunter, T. R.; Paine, S. N.; Patt, F.; Gol'tsman, G.; Cherednichenko, S.; Voronov, B.; Gershenzon, E. |
Superconductive hot-electron-bolometer mixer receiver for 800-GHz operation |
2000 |
IEEE Trans. Microw. Theory Techn. |
48 |
683-689 |
|
|
|
Semenov, A. D.; Gol’tsman, G. N. |
Nonthermal mixing mechanism in a diffusion-cooled hot-electron detector |
2000 |
J. Appl. Phys. |
87 |
502-510 |
|
|
|
Semenov, A. D.; Hübers, H.-W.; Schubert, J.; Gol'tsman, G. N.; Elantiev, A. I.; Voronov, B. M.; Gershenzon, E. M. |
Design and performance of the lattice-cooled hot-electron terahertz mixer |
2000 |
J. Appl. Phys. |
88 |
6758-6767 |
|
|
|
Floet D. W.; Gao J. R.; Klapwijk T. M.; de Korte P. A. J. |
Bias Dependence of the Thermal Time Constant in Nb Superconducting Diffusion-Cooled HEB Mixers |
2000 |
Appl. Phys. Lett. |
77 |
1719 |
|
|
|
Il'in, K. S.; Lindgren, M.; Currie, M. A.; Semenov, D.; Gol'tsman, G. N.; Sobolewski, Roman; Cherednichenko, S. I.; Gershenzon, E. M. |
Picosecond hot-electron energy relaxation in NbN superconducting photodetectors |
2000 |
Appl. Phys. Lett. |
76 |
2752-2754 |
|
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Kawamura, Jonathan; Blundell, Raymond; Tong, C.-Y. Edward; Papa, D. Cosmo; Hunter, Todd R.; Paine, Scot.t. N.; Patt, Ferdinand; Gol'tsman, Gregory; Cherednichenko, Sergei; Voronov, Boris; Gershenzon, Eugene |
Superconductive hot-electron bolometer mixer receiver for 800 GHz operation |
2000 |
IEEE Trans. Microwave Theory and Techniques |
48 |
683-689 |
|
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
|
|
|
Gundlach, K. H.; Schicke, M. |
SIS and bolometer mixers for terahertz frequencies |
2000 |
Supercond. Sci. Technol |
13 |
181-187 |
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