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| Author |
Hadfield, Robert H. |
| Title |
Single-photon detectors for optical quantum information applications |
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Journal Article |
| Year |
2009 |
Publication |
Nature Photonics |
Abbreviated Journal |
Nature Photonics |
| Volume |
3 |
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Pages |
696-705 |
| Keywords |
SPD |
| Abstract |
The past decade has seen a dramatic increase in interest in new single-photon detector technologies. A major cause of this trend has undoubtedly been the push towards optical quantum information applications such as quantum key distribution. These new applications place extreme demands on detector performance that go beyond the capabilities of established single-photon detectors. There has been considerable effort to improve conventional photon-counting detectors and to transform new device concepts into workable technologies for optical quantum information applications. This Review aims to highlight the significant recent progress made in improving single-photon detector technologies, and the impact that these developments will have on quantum optics and quantum information science. |
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RPLAB @ gujma @ |
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678 |
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Takesue, Hiroki; Nam, Sae Woo; Zhang, Qiang; Hadfield, Robert H.; Honjo, Toshimori; Tamaki, Kiyoshi; Yamamoto, Yoshihisa |
| Title |
Quantum key distribution over a 40-dB channel loss using superconducting single-photon detectors |
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Journal Article |
| Year |
2007 |
Publication |
Nature Photonics |
Abbreviated Journal |
Nat. Photon. |
| Volume |
1 |
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343-348 |
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quantum cryptography, SSPD, QKD, DSP |
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RPLAB @ akorneev @ |
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609 |
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Collins, M. J.; Xiong, C.; Rey, I. H.; Vo, T. D.; He, J.; Shahnia, S.; Reardon, C.; Krauss, T. F.; Steel, M. J.; Clark, M.J.; & Eggleton, B.J. |
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Integrated spatial multiplexing of heralded single-photon sources |
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Journal Article |
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2013 |
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Nature Communications |
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The non-deterministic nature of photon sources is a key limitation for single-photon quantum processors. Spatial multiplexing overcomes this by enhancing the heralded single-photon yield without enhancing the output noise. Here the intrinsic statistical limit of an individual source is surpassed by spatially multiplexing two monolithic silicon-based correlated photon pair sources in the telecommunications band, demonstrating a 62.4% increase in the her- alded single-photon output without an increase in unwanted multipair generation. We further demonstrate the scalability of this scheme by multiplexing photons generated in two waveguides pumped via an integrated coupler with a 63.1% increase in the heralded photon rate. This demonstration paves the way for a scalable architecture for multiplexing many photon sources in a compact integrated platform and achieving efficient two-photon inter- ference, required at the core of optical quantum computing and quantum communication protocols. |
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RPLAB @ alex_kazakov @ |
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1001 |
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Heeres, R.W.; Dorenbos, S.N.; Koene, B.; Solomon, G.S.; Kouwenhoven, L.P.; Zwiller, V. |
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On-Chip Single Plasmon Detection |
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Journal Article |
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2010 |
Publication |
Nano Letters |
Abbreviated Journal |
Nano Lett. |
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10 |
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661-664 |
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optical antennas; SSPD; Single surface plasmons; superconducting detectors; semiconductor quantum dots; nanophotonics |
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Surface plasmon polaritons (plasmons) have the potential to interface electronic and optical devices. They could prove extremely useful for integrated quantum information processing. Here we demonstrate on-chip electrical detection of single plasmons propagating along gold waveguides. The plasmons are excited using the single-photon emission of an optically emitting quantum dot. After propagating for several micrometers, the plasmons are coupled to a superconducting detector in the near-field. Correlation measurements prove that single plasmons are being detected. |
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RPLAB @ akorneev @ |
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620 |
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Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
| Title |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
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Journal Article |
| Year |
2000 |
Publication |
Microelectronics Reliability |
Abbreviated Journal |
Microelectronics Reliability |
| Volume |
40 |
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1353-1358 |
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SSPD, CMOS testing |
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Normal operation of complementary metal-oxide semiconductor (CMOS) devices entails the emission of picosecond pulses of light, which can be used to diagnose circuit problems. The pulses that are observed from submicron sized field effect transistors (FETs) are synchronous with logic state switching. Picosecond Imaging Circuit Analysis (PICA), a new optical imaging technique combining imaging with timing, spatially resolves individual devices at the 0.5 micron level and switching events on a 10 picosecond timescale. PICA is used here for the diagnostics of failures on two VLSI microprocessors. |
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1054 |
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