| |
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links  |
|
|
Hadfield, Robert H. |
Single-photon detectors for optical quantum information applications |
2009 |
Nature Photonics |
3 |
696-705 |
|
|
|
Takesue, Hiroki; Nam, Sae Woo; Zhang, Qiang; Hadfield, Robert H.; Honjo, Toshimori; Tamaki, Kiyoshi; Yamamoto, Yoshihisa |
Quantum key distribution over a 40-dB channel loss using superconducting single-photon detectors |
2007 |
Nature Photonics |
1 |
343-348 |
|
|
|
Collins, M. J.; Xiong, C.; Rey, I. H.; Vo, T. D.; He, J.; Shahnia, S.; Reardon, C.; Krauss, T. F.; Steel, M. J.; Clark, M.J.; & Eggleton, B.J. |
Integrated spatial multiplexing of heralded single-photon sources |
2013 |
Nature Communications |
|
|
|
|
|
Heeres, R.W.; Dorenbos, S.N.; Koene, B.; Solomon, G.S.; Kouwenhoven, L.P.; Zwiller, V. |
On-Chip Single Plasmon Detection |
2010 |
Nano Letters |
10 |
661-664 |
|
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
|
