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Author |
Title |
Year |
Publication |
DOI |
Links ![sorted by URL field, descending order (down)](img/sort_desc.gif) |
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Floet D. W.; Gao J. R.; Klapwijk T. M.; de Korte P. A. J. |
Bias Dependence of the Thermal Time Constant in Nb Superconducting Diffusion-Cooled HEB Mixers |
2000 |
Appl. Phys. Lett. |
10.1063/1.1287909 |
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Il'in, K. S.; Lindgren, M.; Currie, M. A.; Semenov, D.; Gol'tsman, G. N.; Sobolewski, Roman; Cherednichenko, S. I.; Gershenzon, E. M. |
Picosecond hot-electron energy relaxation in NbN superconducting photodetectors |
2000 |
Appl. Phys. Lett. |
10.1063/1.126480 |
|
|
Kawamura, Jonathan; Blundell, Raymond; Tong, C.-Y. Edward; Papa, D. Cosmo; Hunter, Todd R.; Paine, Scot.t. N.; Patt, Ferdinand; Gol'tsman, Gregory; Cherednichenko, Sergei; Voronov, Boris; Gershenzon, Eugene |
Superconductive hot-electron bolometer mixer receiver for 800 GHz operation |
2000 |
IEEE Trans. Microwave Theory and Techniques |
10.1109/22.841960 |
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Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
10.1016/S0026-2714(00)00137-2 |
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Gundlach, K. H.; Schicke, M. |
SIS and bolometer mixers for terahertz frequencies |
2000 |
Supercond. Sci. Technol |
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