| Records |
| Author |
Takesue, Hiroki; Nam, Sae Woo; Zhang, Qiang; Hadfield, Robert H.; Honjo, Toshimori; Tamaki, Kiyoshi; Yamamoto, Yoshihisa |
| Title |
Quantum key distribution over a 40-dB channel loss using superconducting single-photon detectors |
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Journal Article |
| Year |
2007 |
Publication |
Nature Photonics |
Abbreviated Journal |
Nat. Photon. |
| Volume |
1 |
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343-348 |
| Keywords |
quantum cryptography, SSPD, QKD, DSP |
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RPLAB @ akorneev @ |
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609 |
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| Author |
Heeres, R.W.; Dorenbos, S.N.; Koene, B.; Solomon, G.S.; Kouwenhoven, L.P.; Zwiller, V. |
| Title |
On-Chip Single Plasmon Detection |
Type |
Journal Article |
| Year |
2010 |
Publication |
Nano Letters |
Abbreviated Journal |
Nano Lett. |
| Volume |
10 |
Issue |
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Pages |
661-664 |
| Keywords |
optical antennas; SSPD; Single surface plasmons; superconducting detectors; semiconductor quantum dots; nanophotonics |
| Abstract |
Surface plasmon polaritons (plasmons) have the potential to interface electronic and optical devices. They could prove extremely useful for integrated quantum information processing. Here we demonstrate on-chip electrical detection of single plasmons propagating along gold waveguides. The plasmons are excited using the single-photon emission of an optically emitting quantum dot. After propagating for several micrometers, the plasmons are coupled to a superconducting detector in the near-field. Correlation measurements prove that single plasmons are being detected. |
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RPLAB @ akorneev @ |
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620 |
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Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
| Title |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
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Journal Article |
| Year |
2000 |
Publication |
Microelectronics Reliability |
Abbreviated Journal |
Microelectronics Reliability |
| Volume |
40 |
Issue |
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Pages |
1353-1358 |
| Keywords |
SSPD, CMOS testing |
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Normal operation of complementary metal-oxide semiconductor (CMOS) devices entails the emission of picosecond pulses of light, which can be used to diagnose circuit problems. The pulses that are observed from submicron sized field effect transistors (FETs) are synchronous with logic state switching. Picosecond Imaging Circuit Analysis (PICA), a new optical imaging technique combining imaging with timing, spatially resolves individual devices at the 0.5 micron level and switching events on a 10 picosecond timescale. PICA is used here for the diagnostics of failures on two VLSI microprocessors. |
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1054 |
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Seki, T.; Shibata, H.; Takesue, H.; Tokura, Y.; Imoto, N. |
| Title |
Comparison of timing jitter between NbN superconducting single-photon detector and avalanche photodiode |
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Journal Article |
| Year |
2010 |
Publication |
Phys. C |
Abbreviated Journal |
Phys. C |
| Volume |
470 |
Issue |
20 |
Pages |
1534-1537 |
| Keywords |
SSPD; APD; jitter |
| Abstract |
We report the pulse-to-pulse timing jitter measurement of a niobium nitride (NbN) superconducting single-photon detector (SSPD) and an InGaAs avalanche photodiode (APD) at 1550-nm wavelength. A direct comparison of their timing jitter was performed by using the same experimental configuration to measure both detectors. The measured jitter of the SSPD and the APD are 75 and 84 ps at full-width at half-maximum (FWHM), and 138 and 384 ps at full-width at tenth-maximum (FWTM), respectively. The jitter of the SSPD remains small at FWTM while that of APD is wide. We also estimated the transmission distances and secure key generation rates for fiber-based quantum key distribution (QKD) which uses these detectors. The estimated transmission distances of the APD are 86 km and 107 km with respect to 1 ns and 100 ps time windows, respectively, and those of the SSPD are 125 km and 172 km with respect to 1 ns and 100 ps time windows, respectively. This estimation indicates the SSPDЃfs advantages for QKD compared to the APD. |
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RPLAB @ akorneev @ |
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613 |
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Ferrari, S.; Kovalyuk, V.; Hartmann, W.; Vetter, A.; Kahl, O.; Lee, C.; Korneev, A.; Rockstuhl, C.; Gol'tsman, G.; Pernice, W. |
| Title |
Hot-spot relaxation time current dependence in niobium nitride waveguide-integrated superconducting nanowire single-photon detectors |
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Journal Article |
| Year |
2017 |
Publication |
Opt. Express |
Abbreviated Journal |
Opt. Express |
| Volume |
25 |
Issue |
8 |
Pages |
8739-8750 |
| Keywords |
SSPD, SNSPD, photon counting; Infrared; Quantum detectors; Integrated optics; Multiphoton processes; Photon statistics |
| Abstract |
We investigate how the bias current affects the hot-spot relaxation dynamics in niobium nitride. We use for this purpose a near-infrared pump-probe technique on a waveguide-integrated superconducting nanowire single-photon detector driven in the two-photon regime. We observe a strong increase in the picosecond relaxation time for higher bias currents. A minimum relaxation time of (22 +/- 1)ps is obtained when applying a bias current of 50% of the switching current at 1.7 K bath temperature. We also propose a practical approach to accurately estimate the photon detection regimes based on the reconstruction of the measured detector tomography at different bias currents and for different illumination conditions. |
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RPLAB @ kovalyuk @ |
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1118 |
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