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Author |
Title |
Year |
Publication |
DOI |
Links  |
|
|
Takesue, Hiroki; Nam, Sae Woo; Zhang, Qiang; Hadfield, Robert H.; Honjo, Toshimori; Tamaki, Kiyoshi; Yamamoto, Yoshihisa |
Quantum key distribution over a 40-dB channel loss using superconducting single-photon detectors |
2007 |
Nature Photonics |
10.1038/nphoton.2007.75 |
|
|
|
Heeres, R.W.; Dorenbos, S.N.; Koene, B.; Solomon, G.S.; Kouwenhoven, L.P.; Zwiller, V. |
On-Chip Single Plasmon Detection |
2010 |
Nano Letters |
10.1021/nl903761t |
|
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
10.1016/S0026-2714(00)00137-2 |
|
|
|
Seki, T.; Shibata, H.; Takesue, H.; Tokura, Y.; Imoto, N. |
Comparison of timing jitter between NbN superconducting single-photon detector and avalanche photodiode |
2010 |
Phys. C |
10.1016/j.physc.2010.05.156 |
|
|
|
Ferrari, S.; Kovalyuk, V.; Hartmann, W.; Vetter, A.; Kahl, O.; Lee, C.; Korneev, A.; Rockstuhl, C.; Gol'tsman, G.; Pernice, W. |
Hot-spot relaxation time current dependence in niobium nitride waveguide-integrated superconducting nanowire single-photon detectors |
2017 |
Opt. Express |
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