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Author Sahu, Mitrabhanu; Bae, Myung-Ho; Rogachev, Andrey; Pekker, David; Wei, Tzu-Chieh; Shah, Nayana; Goldbart, Paul M.; Bezryadin, Alexey
Title Individual topological tunnelling events of a quantum field probed through their macroscopic consequences Type Journal Article
Year 2009 Publication Nature Phys. Abbreviated Journal Nature Phys.
Volume 5 Issue Pages 503-508
Keywords phase slips, superconducting nanowires
Abstract Phase slips are topological fluctuations that carry the superconducting order-parameter field between distinct current-carrying states. Owing to these phase slips, superconducting nanowires acquire electrical resistance. In such wires, it is well known that at higher temperatures phase slips occur through the process of thermal barrier-crossing by the order-parameter field. At low temperatures, the general expectation is that phase slips should proceed through quantum tunnelling events, which are known as quantum phase slips. However, resistive measurements have produced evidence both for and against the occurrence of quantum phase slips. Here, we report evidence for the observation of individual quantum phase-slip events in homogeneous ultranarrow wires at high bias currents. We accomplish this through measurements of the distribution of switching currents for which the width exhibits a rather counter-intuitive, monotonic increase with decreasing temperature. Importantly, measurements show that in nanowires with larger critical currents, quantum fluctuations dominate thermal fluctuations up to higher temperatures.
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Notes Recommended by Klapwijk Approved no
Call Number Serial 928
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Author Thijs de Graauw; Nick Whyborn; Frank Helmich; Pieter Dieleman; Peter Roelfsema; Emmanuel Caux; Tom Phillips; Jürgen Stutzki; Douwe Beintema; Arnold Benz; Nicolas Biver; Adwin Boogert; Francois Boulanger; Sergey Cherednichenko; Odile Coeur-Joly; Claudia Comito; Emmanuel Dartois; Albrecht de Jonge; Gert de Lange; Ian Delorme; Anna DiGiorgio; Luc Dubbeldam; Kevin Edwards; Michael Fich; Rolf Güsten; Fabrice Herpin; Netty Honingh; Robert Huisman; Herman Jacobs; Willem Jellema; Jon Kawamura; Do Kester; Teun Klapwijk; Thomas Klein; Jacob Kooi; Jean-Michel Krieg; Carsten Kramer; Bob Kruizenga; Wouter Laauwen; Bengt Larsson; Christian Leinz; Rene Liseau; Steve Lord; Willem Luinge; Anthony Marston; Harald Merkel; Rafael Moreno; Patrick Morris; Anthony Murphy; Albert Naber; Pere Planesas; Jesus Martin-Pintado; Micheal Olberg; Piotr Orleanski; Volker Ossenkopf; John Pearson; Michel Perault; Sabine Phillip; Mirek Rataj; Laurent Ravera; Paolo Saraceno; Rudolf Schieder; Frank Schmuelling; Ryszard Szczerba; Russell Shipman; David Teyssier; Charlotte Vastel; Huib Visser; Klaas Wildeman; Kees Wafelbakker; John Ward; Roonan Higgins; Henri Aarts; Xander Tielens; Peer Zaal
Title The Herschel-heterodyne instrument for the far-infrared (HIFI): instrument and pre-launch testing Type Conference Article
Year 2008 Publication Proc. SPIE Abbreviated Journal
Volume 7010 Issue Pages 701004
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Notes Approved no
Call Number Serial 422
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Author Mair, U.; Suttywong, N.; Hübers, H.-W.; Semenov, A. D.; Richter, H.; Wagner, G.; Birk, M.
Title Development of 1.8 THz receiver for the TELIS instrument Type Conference Article
Year 2005 Publication Proc. 16th Int. Symp. Space Terahertz Technol. Abbreviated Journal
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Publisher Place of Publication Göteborg, Sweden Editor
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Call Number RPLAB @ s @ qo_TELIS_1p8_THz Serial 364
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Author Hong, Kyushik; Marsh, P. F.; Geok-Ing Ng; Pavlidis, D.; Hong, Chang-Hee
Title Optimization of MOVPE grown InxAl1-xAs/In0.53Ga0.47As planar heteroepitaxial Schottky diodes for terahertz applications Type Journal Article
Year 1994 Publication IEEE Trans. Electron Devices Abbreviated Journal
Volume 41 Issue 9 Pages 1489-1497
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Call Number Serial 253
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Author Hesler, J. L.; Hall, W. R.; Crowe, T. W.; Weikle, R. M.; Bradley, R. F.; Pan, Shing-Kuo
Title Submm wavelenght waveguide mixers using planar Schottky barier diods Type Conference Article
Year 1996 Publication Proc. 7th Int. Symp. Space Terahertz Technol. Abbreviated Journal
Volume Issue Pages 462
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Call Number Serial 270
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