Author |
Title |
Year |
Publication |
Volume |
Pages |
Zhang, J.; Pearlman, A.; Slysz, W.; Verevkin, A.; Sobolewski, R.; Okunev, O.; Korneev, A.; Kouminov, P.; Smirnov, K.; Chulkova, G.; Gol’tsman, G. N.; Lo, W.; Wilsher, K. |
Infrared picosecond superconducting single-photon detectors for CMOS circuit testing |
2003 |
CLEO/QELS |
|
Cmv4 |
Zhang, J.; Pearlman, A.; Slysz, W.; Verevkin, A.; Sobolewski, R.; Wilsher, K.; Lo, W.; Okunev, O.; Korneev, A.; Kouminov, P.; Chulkova, G.; Gol’tsman, G. N. |
A superconducting single-photon detector for CMOS IC probing |
2003 |
Proc. 16-th LEOS |
2 |
602-603 |
Sobolewski, R.; Verevkin, A.; Gol'tsman, G.N.; Lipatov, A.; Wilsher, K. |
Ultrafast superconducting single-photon optical detectors and their applications |
2003 |
IEEE Trans. Appl. Supercond. |
13 |
1151-1157 |
Somani, S.; Kasapi, S.; Wilsher, K.; Lo, W.; Sobolewski, R.; Gol’tsman, G. |
New photon detector for device analysis: Superconducting single-photon detector based on a hot electron effect |
2001 |
J. Vac. Sci. Technol. B |
19 |
2766-2769 |
Zhang, J.; Boiadjieva, N.; Chulkova, G.; Deslandes, H.; Gol'tsman, G. N.; Korneev, A.; Kouminov, P.; Leibowitz, M.; Lo, W.; Malinsky, R.; Okunev, O.; Pearlman, A.; Slysz, W.; Smirnov, K.; Tsao, C.; Verevkin, A.; Voronov, B.; Wilsher, K.; Sobolewski, R. |
Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors |
2003 |
Electron. Lett. |
39 |
1086-1088 |