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Gershenzon, E. M.; Gol'tsman, G. N. |
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Transitions of electrons between excited states of donors in germanium |
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1971 |
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JETP Lett. |
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JETP Lett. |
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14 |
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2 |
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63-65 |
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Ge, donors, excited states |
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1740 |
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Miller, Aaron J.; Lita, Adriana E.; Calkins, Brice; Vayshenker, Igor; Gruber, Steven M.; Nam, Sae Woo |
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Title |
Compact cryogenic self-aligning fiber-to-detector coupling with losses below one percent |
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Journal Article |
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2011 |
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Optics Express |
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Opt. Express |
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19 |
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10 |
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9102-9110 |
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Keywords |
TES |
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We present a compact packaging technique for coupling light from a single-mode telecommunication fiber to cryogenic single-photon sensitive devices. Our single-photon detectors are superconducting transition-edge sensors (TESs) with a collection area only a factor of a few larger than the area of the fiber core which presents significant challenges to low-loss fiber-to-detector coupling. The coupling method presented here has low loss, cryogenic compatibility, easy and reproducible assembly and low component cost. The system efficiency of the packaged single-photon counting detectors is verified by the “triplet method†of power-source calibration along with the “multiple attenuator†method that produces a calibrated single-photon flux. These calibration techniques, when used in combination with through-wafer imaging and fiber back-reflection measurements, give us confidence that we have achieved coupling losses below 1 % for all devices packaged according to the self-alignment method presented in this paper. |
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RPLAB @ gujma @ |
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666 |
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Galeazzi, Massimiliano |
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Title |
Fundamental noise processes in TES devices |
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2011 |
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IEEE Trans. Appl. Supercond. |
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IEEE Trans. Appl. Supercond. |
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21 |
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3 |
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267-271 |
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TES, Johnson noise, phonon noise, excess noise, flux-flow noise, thermal fluctuation noise |
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Microcalorimeters and bolometers are noise-limited devices, therefore, a proper understanding of all noise sources is essential to predict and interpret their performance. In this paper, I review the fundamental noise processes contributing to Transition Edge Sensor (TES) microcalorimeters and bolometers and their effect on device performance. In particular, I will start with a simple, monolithic device model, moving to a more complex one involving discrete components, to finally move to today's more realistic, comprehensive model. In addition to the basic noise contribution (equilibrium Johnson noise and phonon noise), TES are significantly affected by extra noise, which is commonly referred to as excess noise. Different fundamental processes have been proposed and investigated to explain the origin of this excess noise, in particular near equilibrium non-linear Johnson noise, flux-flow noise, and internal thermal fluctuation noise. Experimental evidence shows that all three processes are real and contribute, at different levels, to the TES noise, although different processes become important at different regimes. It is therefore time to discard the term “excess noise” and consider these terms part of the “fundamental noise processes” instead. |
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Recommended by Klapwijk |
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914 |
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Author |
Gershenzon, E. M.; Orlov, L. A.; Ptitsina, N. G. |
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Title |
Absorption spectra in electron transitions between excited states of impurities in germanium |
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Year |
1975 |
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JETP Lett. |
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JETP Lett. |
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Volume |
22 |
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4 |
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95-97 |
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Ge, impurities, excited states, absorption spectra |
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1773 |
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Gershenzon, E.M.; Gol'tsman, G.N.; Ptitsyna, N. G. |
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Title |
Carrier lifetime in excited states of shallow impurities in germanium |
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Year |
1977 |
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JETP Lett. |
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JETP Lett. |
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25 |
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12 |
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539-543 |
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Ge, shallow impurities, excited states |
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1726 |
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