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Gershenzon, E. M., Gol’tsman, G. N., Sergeev, A., & Semenov, A. D. (1990). Picosecond response of YBaCuO films to electromagnetic radiation. In W. Gorzkowski, M. Gutowski, A. Reich, & H. Szymczak (Eds.), Proc. European Conf. High-Tc Thin Films and Single Crystals (pp. 457–462).
Abstract: Radiation-induced change of the resistance was studied in the resistive state of YBaCuO films. Electron-phonon relaxation time T h was determmed from direct ep measurements and analysis of quasistationary electron heating. Temperature dependence of That TS 40 K was found to – ep be T h.. T'. The resul ts show that ep detectors with the response time of few picosecond at nitrogen temperature can be realized.
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Matyushkin, Y., Fedorov, G., Moskotin, M., Danilov, S., Ganichev, S., & Goltsman, G. (2020). Gate-mediated helicity sensitive detectors of terahertz radiation with graphene-based field effect transistors. In Graphene and 2dm Virt. Conf..
Abstract: Closing of the so-called terahertz gap results in an increased demand for optoelectronic devices operating in the frequency range from 0.1 to 10 THz. Active plasmonic in field effect devices based on high-mobility two-dimensional electron gas (2DEG) opens up opportunities for creation of on-chip spectrum [1] and polarization [2] analysers. Here we show that single layer graphene (SLG) grown using CVD method can be used for an all-electric helicity sensitive polarization broad analyser of THz radiation. Allourresults show plasmonic nature of response. Devices are made in a configuration ofa field-effect transistor (FET) with a graphene channel that has a length of 2 mkm and a width of 5.5 mkm. Response of opposite polarity to clockwise and anticlockwise polarized radiation is due to special antenna design (see Fig.1c) as follow works [2,3]. Our approaches can be extrapolated to other 2D materials and used as a tool to characterize plasmonic excitations in them. [1]Bandurin, D. A., etal.,Nature Communications, 9(1),(2018),1-8.[2]Drexler, C.,etal.,Journal of Applied Physics, 111(12),(2012),124504.[3]Gorbenko, I. V.,et al.,physica status solidi (RRL)–Rapid Research Letters, 13(3),(2019),1800464.
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