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Zubkova, E., An, P., Kovalyuk, V., Korneev, A., & Goltsman, G. (2017). Integrated Bragg waveguides as an efficient optical notch filter on silicon nitride platform. In Proc. SPBOPEN (pp. 449–450).
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Goltsman, G. (2017). Superconducting thin film as infrared heterodyne and direct detectors. In 16th ISEC (pp. 1–3).
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Korneev, A., Semenov, A., Vodolazov, D., Gol’tsman, G. N., & Sobolewski, R. (2017). Physics and operation of superconducting single-photon devices. In R. Wördenweber, V. Moshchalkov, S. Bending, & F. Tafuri (Eds.), Superconductors at the Nanoscale (pp. 279–308). De Gruyter.
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Goltsman, G. (2017). Superconducting thin film nanostructures as terahertz and infrared heterodyne and direct detectors. In 16th ISEC (Th-I-QTE-03 (1 to 3)).
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Pentin, I., Finkel, M., Maslennikov, S., Vakhtomin, Y., Smirnov, K., Kaurova, N., et al. (2017). Superconducting hot-electron-bolometer mixers for the mid-IR. Rus. J. Radio Electron., (10), http://jre.cplire.ru/jre/oct17/9/text.pdf. Retrieved July 1, 2024, from http://jre.cplire.ru/jre/oct17/9/abstract_e.html
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Kahl, O., Ferrari, S., Kovalyuk, V., Vetter, A., Lewes-Malandrakis, G., Nebel, C., et al. (2017). Spectrally multiplexed single-photon detection with hybrid superconducting nanophotonic circuits. Optica, 4(5), 557–562.
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Klapwijk, T. M., & Semenov, A. V. (2017). Engineering physics of superconducting hot-electron bolometer mixers. IEEE Trans. THz Sci. Technol., 7(6), 627–648.
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Vorobyov, V. V., Kazakov, A. Y., Soshenko, V. V., Korneev, A. A., Shalaginov, M. Y., Bolshedvorskii, S. V., et al. (2017). Superconducting detector for visible and near-infrared quantum emitters [Invited]. Opt. Mater. Express, 7(2), 513–526.
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Kovalyuk, V., Ferrari, S., Kahl, O., Semenov, A., Shcherbatenko, M., Lobanov, Y., et al. (2017). On-chip coherent detection with quantum limited sensitivity. Sci Rep, 7(1), 4812.
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Finkel, M., Thierschmann, H., Galatro, L., Katan, A. J., Thoen, D. J., de Visser, P. J., et al. (2017). Performance of THz components based on microstrip PECVD SiNx technology. IEEE Trans. THz Sci. Technol., 7(6), 765–771.
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