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Korneev, A., Golt'sman, G., & Pernice, W. (2015). Photonic integration meets single-photon detection (Vol. 51).
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Kurochkin, V. L., Zverev, A. V., Kurochkin, Y. V., Ryabtsev, I. I., Neizvestnyi, I. G., Ozhegov, R. V., et al. (2015). Long-distance fiber-optic quantum key distribution using superconducting detectors. In Proc. Optoelectron. Instrum. (Vol. 51, pp. 548–552).
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Verevkin, A., Pearlman, A., Slysz, W., Zhang, J., Currie, M., Korneev, A., et al. (2004). Ultrafast superconducting single-photon detectors for near-infrared-wavelength quantum communications. J. Modern Opt., 51(9-10), 1447–1458.
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Słysz, W., Wegrzecki, M., Bar, J., Grabiec, P., Górska, M., Zwiller, V., et al. (2007). Fibre-coupled, single photon detector based on NbN superconducting nanostructures for quantum communications. J. Modern Opt., 54(2-3), 315–326.
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Goltsman, G., Korneev, A., Divochiy, A., Minaeva, O., Tarkhov, M., Kaurova, N., et al. (2009). Ultrafast superconducting single-photon detector. J. Modern Opt., 56(15), 1670–1680.
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Dauler, E., Kerman, A., Robinson, B., Yang, J., Voronov, B., Goltsman, G., et al. (2009). Photon-number-resolution with sub-30-ps timing using multi-element superconducting nanowire single photon detectors. J. Modern Opt., 56(2), 364–373.
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Marsili, F., Bitauld, D., Fiore, A., Gaggero, A., Leoni, R., Mattioli, F., et al. (2009). Superconducting parallel nanowire detector with photon number resolving functionality. J. Modern Opt., 56(2-3), 334–344.
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Smirnov, K., Korneev, A., Minaeva, O., Divochiy, A., Tarkhov, M., Ryabchun, S., et al. (2007). Ultrathin NbN film superconducting single-photon detector array. In J. Phys.: Conf. Ser. (Vol. 61, pp. 1081–1085).
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Zhang, J., Słysz, W., Pearlman, A., Verevkin, A., Sobolewski, R., Okunev, O., et al. (2003). Time delay of resistive-state formation in superconducting stripes excited by single optical photons. Phys. Rev. B, 67(13), 132508 (1 to 4).
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Korneev, A., Lipatov, A., Okunev, O., Chulkova, G., Smirnov, K., Gol’tsman, G., et al. (2003). GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits. Microelectronic Engineering, 69(2-4), 274–278.
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