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Author Slysz, W.; Wegrzecki, M.; Papis, E.; Gol'tsman, G. N.; Verevkin, A.; Sobolewski, R. url  openurl
  Title A method of optimization of the NbN superconducting single-photon detector Type Miscellaneous
  Year 2004 Publication INIS Abbreviated Journal INIS  
  Volume (down) 36 Issue 27 Pages 1-2  
  Keywords NbN SSPD, SNSPD  
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  Area Expedition Conference 5-th International Symposium Ion Implantation and Other Applications of Ions and Electrons, ION  
  Notes Reference num. 36060124 Approved no  
  Call Number Serial 1485  
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Author Gershenzon, E. M.; Gershenzon, M. E.; Gol'tsman, G. N.; Semenov, A. D.; Sergeev, A. V. url  openurl
  Title Nonselective effect of electromagnetic radiation on a superconducting film in the resistive state Type Journal Article
  Year 1982 Publication JETP Lett. Abbreviated Journal JETP Lett.  
  Volume (down) 36 Issue 7 Pages 296-299  
  Keywords HEB  
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  Notes Неселективное воздействие электромагнитного излучения на сверхпроводящую пленку в резистивном состоянии Approved no  
  Call Number Serial 1717  
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Author Korneeva, Y. P.; Manova, N. N.; Dryazgov, M. A.; Simonov, N. O.; Zolotov, P. I.; Korneev, A. A. url  doi
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  Title Influence of sheet resistance and strip width on the detection efficiency saturation in micron-wide superconducting strips and large-area meanders Type Journal Article
  Year 2021 Publication Supercond. Sci. Technol. Abbreviated Journal Supercond. Sci. Technol.  
  Volume (down) 34 Issue 8 Pages 084001  
  Keywords NbN SSPD, SMSPD  
  Abstract We report our study of detection efficiency (DE) saturation in wavelength range 400 – 1550 nm for the NbN Superconducting Microstrip Single-Photon Detectors (SMSPD) featuring the strip width up to 3 μm. We observe an expected decrease of the $DE$ saturation plateau with the increase of photon wavelength and decrease of film sheet resistance. At 1.7 K temperature DE saturation can be clearly observed at 1550 nm wavelength in strip with the width up to 2 μm when sheet resistance of the film is above 630Ω/sq. In such strips the length of the saturation plateau almost does not depend on the strip width. We used these films to make meander-shaped detectors with the light sensitive area from 20×20μm2 to a circle 50 μm in diameter. In the latter case, the detector with the strip width of 0.49 μm demonstrates saturation of DE up to 1064 nm wavelength. Although DE at 1310 and 1550 nm is not saturated, it is as high as 60%. The response time is limited by the kinetic inductance and equals to 20 ns(by 1/e decay), timing jitter is 44 ps. When coupled to multi-mode fibre large-area meanders demonstrate significantly higher dark count rate which we attribute to thermal background photons, thus advanced filtering technique would be required for practical applications.  
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  ISSN 0953-2048 ISBN Medium  
  Area Expedition Conference  
  Notes Approved no  
  Call Number Serial 1793  
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Author Polyakova, O. N.; Tikhonov, V. V.; Dzardanov, A. L.; Boyarskii, D. A.; Gol’tsman, G. N. url  doi
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  Title Dielectric characteristics of ore minerals in a 10–40 GHz frequency range Type Journal Article
  Year 2008 Publication Tech. Phys. Lett. Abbreviated Journal Tech. Phys. Lett.  
  Volume (down) 34 Issue 11 Pages 967-970  
  Keywords ore minerals, complex permittivity, sphalerite, magnetite, labradorite  
  Abstract A new approach to investigation of the complex dielectric permittivity of both nonmetallic and ore minerals in the microwave frequency range is proposed. Using this approach, data on the complex permittivity of sphalerite, magnetite, and labradorite in a 10–40 GHz frequency range have been obtained for the first time. A method is proposed for calculating the complex permittivity from experimentally measured frequency dependences of the reflection and transmission coefficients of a plane-parallel plate of a given mineral. Approximate expressions that can be used for calculations of the complex refractive index and permittivity of minerals are presented.  
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  ISSN 1063-7850 ISBN Medium  
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  Notes Approved no  
  Call Number Serial 1406  
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Author Beebe, M. R.; Beringer, D. B.; Burton, M. C.; Yang, K.; Lukaszew, R. A. url  doi
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  Title Stoichiometry and thickness dependence of superconducting properties of niobium nitride thin films Type Journal Article
  Year 2016 Publication Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films Abbreviated Journal Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films  
  Volume (down) 34 Issue 2 Pages 021510 (1 to 4)  
  Keywords potential plagiarism, possible plagiarism, NbN films  
  Abstract The current technology used in linear particle accelerators is based on superconducting radio frequency (SRF) cavities fabricated from bulk niobium (Nb), which have smaller surface resistance and therefore dissipate less energy than traditional nonsuperconducting copper cavities. Using bulk Nb for the cavities has several advantages, which are discussed elsewhere; however, such SRF cavities have a material-dependent accelerating gradient limit. In order to overcome this fundamental limit, a multilayered coating has been proposed using layers of insulating and superconducting material applied to the interior surface of the cavity. The key to this multilayered model is to use superconducting thin films to exploit the potential field enhancement when these films are thinner than their London penetration depth. Such field enhancement has been demonstrated in MgB2 thin films; here, the authors consider films of another type-II superconductor, niobium nitride (NbN). The authors present their work correlating stoichiometry and superconducting properties in NbN thin films and discuss the thickness dependence of their superconducting properties, which is important for their potential use in the proposed multilayer structure. While there are some previous studies on the relationship between stoichiometry and critical temperature TC, the authors are the first to report on the correlation between stoichiometry and the lower critical field HC1.  
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  ISSN 0734-2101 ISBN Medium  
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  Notes Potential plagiarism for 1503 Approved no  
  Call Number Serial 1504  
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