| Author |
Title |
Year  |
Publication |
Volume |
Pages |
| Okunev, O.; Smirnov, K.; Chulkova, G.; Korneev, A.; Lipatov, A.; Gol'tsman, G.; Zhang, J.; Slysz, W.; Verevkin, A.; Sobolewski, Roman |
Ultrafast NBN hot-electron single-photon detectors for electronic applications |
2002 |
Abstracts 8-th IUMRS-ICEM |
|
|
| Lipatov, A.; Okunev, O.; Smirnov, K.; Chulkova, G.; Korneev, A.; Kouminov, P.; Gol'tsman, G.; Zhang, J.; Slysz, W.; Verevkin, A.; Sobolewski, R. |
An ultrafast NbN hot-electron single-photon detector for electronic applications |
2002 |
Supercond. Sci. Technol. |
15 |
1689-1692 |
| Sobolewski, R.; Verevkin, A.; Gol'tsman, G.N.; Lipatov, A.; Wilsher, K. |
Ultrafast superconducting single-photon optical detectors and their applications |
2003 |
IEEE Trans. Appl. Supercond. |
13 |
1151-1157 |
| Semenov, A.; Engel, A.; Il'in, K.; Gol'tsman, G.; Siegel, M.; Hübers, H.-W. |
Ultimate performance of a superconducting quantum detector |
2003 |
Eur. Phys. J. Appl. Phys. |
21 |
171-178 |
| Zhang, J.; Pearlman, A.; Slysz, W.; Verevkin, A.; Sobolewski, R.; Wilsher, K.; Lo, W.; Okunev, O.; Korneev, A.; Kouminov, P.; Chulkova, G.; Gol’tsman, G. N. |
A superconducting single-photon detector for CMOS IC probing |
2003 |
Proc. 16-th LEOS |
2 |
602-603 |
| Korneev, A.; Lipatov, A.; Okunev, O.; Chulkova, G.; Smirnov, K.; Gol’tsman, G.; Zhang, J.; Slysz, W.; Verevkin, A.; Sobolewski, R. |
GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits |
2003 |
Microelectronic Engineering |
69 |
274-278 |
| Zhang, J.; Boiadjieva, N.; Chulkova, G.; Deslandes, H.; Gol'tsman, G. N.; Korneev, A.; Kouminov, P.; Leibowitz, M.; Lo, W.; Malinsky, R.; Okunev, O.; Pearlman, A.; Slysz, W.; Smirnov, K.; Tsao, C.; Verevkin, A.; Voronov, B.; Wilsher, K.; Sobolewski, R. |
Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors |
2003 |
Electron. Lett. |
39 |
1086-1088 |
| Sobolewski, R.; Zhang, J.; Slysz, W.; Pearlman, A.; Verevkin, A.; Lipatov, A.; Okunev, O.; Chulkova, G.; Korneev, A.; Smirnov, K.; Kouminov, P.; Voronov, B.; Kaurova, N.; Drakinsky, V.; Goltsman, G. N. |
Ultrafast superconducting single-photon optical detectors |
2003 |
Proc. SPIE |
5123 |
1-11 |
| Verevkin, A. A.; Pearlman, A.; Slysz, W.; Zhang, J.; Sobolewski, R.; Chulkova, G.; Okunev, O.; Kouminov, P.; Drakinskij, V.; Smirnov, K.; Kaurova, N.; Voronov, B.; Gol’tsman, G.; Currie, M. |
Ultrafast superconducting single-photon detectors for infrared wavelength quantum communications |
2003 |
Proc. SPIE |
5105 |
160-170 |
| Gol’tsman, G. N.; Smirnov, K.; Kouminov, P.; Voronov, B.; Kaurova, N.; Drakinsky, V.; Zhang, J.; Verevkin, A.; Sobolewski, R. |
Fabrication of nanostructured superconducting single-photon detectors |
2003 |
IEEE Trans. Appl. Supercond. |
13 |
192-195 |
| Zhang, J.; Słysz, W.; Pearlman, A.; Verevkin, A.; Sobolewski, R.; Okunev, O.; Chulkova, G.; Gol’tsman, G. N. |
Time delay of resistive-state formation in superconducting stripes excited by single optical photons |
2003 |
Phys. Rev. B |
67 |
132508 (1 to 4) |
| Slysz, W.; Wegrzecki, M.; Papis, E.; Gol'tsman, G. N.; Verevkin, A.; Sobolewski, R. |
A method of optimization of the NbN superconducting single-photon detector |
2004 |
INIS |
36 |
1-2 |
| Slysz, W.; Wegrzecki, M.; Bar, J.; Grabiec, P.; Gol'tsman, G. N.; Verevkin, M.; Sobolewski, R. |
NbN superconducting single-photon detectors coupled with a communication fiber |
2004 |
INIS |
37 |
1-2 |
| Verevkin, A.; Pearlman, A.; Slysz, W.; Zhang, J.; Currie, M.; Korneev, A.; Chulkova, G.; Okunev, O.; Kouminov, P.; Smirnov, K.; Voronov, B.; Gol'tsman, G. N.; Sobolewski, R. |
Ultrafast superconducting single-photon detectors for near-infrared-wavelength quantum communications |
2004 |
J. Modern Opt. |
51 |
1447-1458 |
| Goltsman, G.; Korneev, A.; Izbenko, V.; Smirnov, K.; Kouminov, P.; Voronov, B.; Kaurova, N.; Verevkin, A.; Zhang, J.; Pearlman, A.; Slysz, W.; Sobolewski, R. |
Nano-structured superconducting single-photon detectors |
2004 |
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
520 |
527-529 |
