| Author |
Title |
Year  |
Publication |
Volume |
Pages |
| Tong, C.-Y.E.; Meledin, D.V.; Marrone, D.P.; Paine, S.N.; Gibson, H.; Blundell, R. |
Near field vector beam measurements at 1 THz |
2003 |
IEEE Microw. Compon. Lett. |
13 |
235-237 |
| Zhang, Jin; Slysz, W.; Verevkin, A.; Okunev, O.; Chulkova, G.; Korneev, A.; Lipatov, A.; Gol'tsman, G. N.; Sobolewski, R. |
Response time characterization of NbN superconducting single-photon detectors |
2003 |
IEEE Trans. Appl. Supercond. |
13 |
180-183 |
| Meledin, D.; Tong, C.-Y. E.; Blundell, R.; Goltsman, G. |
Measurement of intermediate frequency bandwidth of hot electron bolometer mixers at terahertz frequency range |
2003 |
IEEE Microw. Wireless Compon. Lett. |
13 |
493-495 |
| Korneev, A.; Lipatov, A.; Okunev, O.; Chulkova, G.; Smirnov, K.; Gol’tsman, G.; Zhang, J.; Slysz, W.; Verevkin, A.; Sobolewski, R. |
GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits |
2003 |
Microelectronic Engineering |
69 |
274-278 |
| Zhang, J.; Boiadjieva, N.; Chulkova, G.; Deslandes, H.; Gol'tsman, G. N.; Korneev, A.; Kouminov, P.; Leibowitz, M.; Lo, W.; Malinsky, R.; Okunev, O.; Pearlman, A.; Slysz, W.; Smirnov, K.; Tsao, C.; Verevkin, A.; Voronov, B.; Wilsher, K.; Sobolewski, R. |
Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors |
2003 |
Electron. Lett. |
39 |
1086-1088 |
