Author |
Title |
Year |
Publication |
Volume |
Pages |
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
Gupta, D.; Kadin, A. M. |
Single-photon-counting hotspot detector with integrated RSFQ readout electronics |
1999 |
IEEE Trans. Appl. Supercond. |
9 |
4487-4490 |
Il'in, K. S.; Verevkin, A. A.; Gol'tsman, G. N.; Sobolewski, R. |
Infrared hot-electron NbN superconducting photodetectors for imaging applications |
1999 |
Supercond. Sci. Technol. |
12 |
755-758 |
Il'in, K. S.; Currie, M.; Lindgren, M.; Milostnaya, I. I.; Verevkin, A. A.; Gol'tsman, G. N.; Sobolewski, R. |
Quantum efficiency and time-domain response of superconducting NbN hot-electron photodetectors |
1999 |
IEEE Trans. Appl. Supercond. |
9 |
3338-3341 |
Il'in, K. S.; Gol'tsman, G. N.; Voronov, B. M.; Sobolewski, Roman |
Characterization of the electron energy relaxation process in NbN hot-electron devices |
1999 |
Proc. 10th Int. Symp. Space Terahertz Technol. |
|
390-397 |
Il’in, K. S.; Milostnaya, I. I.; Verevkin, A. A.; Gol’tsman, G. N.; Gershenzon, E. M.; Sobolewski, R. |
Ultimate quantum efficiency of a superconducting hot-electron photodetector |
1998 |
Appl. Phys. Lett. |
73 |
3938-3940 |
Lindgren, M.; Currie, M.; Zeng, W.-S.; Sobolewski, R.; Cherednichenko, S.; Voronov, B.; Gol'tsman, G. N. |
Picosecond response of a superconducting hot-electron NbN photodetector |
1998 |
Appl. Supercond. |
6 |
423-428 |