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Author Tret'yakov, I. V.; Kaurova, N. S.; Voronov, B. M.; Anfert'ev, V. A.; Revin, L. S.; Vaks, V. L.; Gol'tsman, G. N. doi  openurl
  Title The influence of the diffusion cooling on the noise band of the superconductor NbN hot-electron bolometer operating in the terahertz range Type Journal Article
  Year (down) 2016 Publication Tech. Phys. Lett. Abbreviated Journal  
  Volume 42 Issue 6 Pages 563-566  
  Keywords HEB, noise bandwidth, conversion gain bandwidth, noise temperature, Andreev reflection  
  Abstract Results of an experimental study of the noise temperature (Tn) and noise bandwidth (NBW) of the superconductor NbN hot-electron bolometer (HEB) mixer as a function of its temperature (Tb) are presented. It was determined that the NBW of the mixer is significantly wider at temperatures close to the critical ones (Tc) than are values measured at 4.2 K. The NBW of the mixer measured at the heterodyne frequency of 2.5 THz at temperature Tb close to Tc was ~13 GHz, as compared with 6 GHz at Tb = 4.2 K. This experiment clearly demonstrates the limitation of the thermal flow from the NbN bridge at Tb â‰<aa> Tc for mixers manufactured by the in situ technique. This limitation is close in its nature to the Andreev reflection on the superconductor/ metal boundary. In this case, the noise temperature of the studied mixer increased from 1100 to 3800 K.  
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  Call Number Serial 1106  
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Author Maslennikov, S. url  openurl
  Title RF heating efficiency of the terahertz superconducting hot-electron bolometer Type Journal Article
  Year (down) 2014 Publication arXiv Abbreviated Journal arXiv  
  Volume 1404.5276 Issue Pages 1-4  
  Keywords superconducting hot-electron bolometer mixer, HEB, NbN, distributed model, HEB model, HEB mixer model, heat balance equa-tions, conversion gain, RF heating efficiency, noise temperature, simulation, Euler method  
  Abstract We report results of the numerical solution by the Euler method of the system of heat balance equations written in recurrent form for the superconducting hot-electron bolometer (HEB) embedded in an electrical circuit. By taking into account the dependence of the HEB resistance on the transport current we have been able to calculate rigorously the RF heating efficiency, absorbed local oscillator (LO) power and conversion gain of the HEB mixer. We show that the calculated conversion gai nis in excellent agreement with the experimental results, and that the substitution of the calculated RF heating efficiency and absorbed LO power into the expressions for the conversion gain and noise temperature given by the analytical small-signal model of the HEB yields excellent agreement with the corresponding measured values  
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  Call Number RPLAB @ atomics90 @ Serial 954  
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Author Galeazzi, Massimiliano openurl 
  Title Fundamental noise processes in TES devices Type Journal Article
  Year (down) 2011 Publication IEEE Trans. Appl. Supercond. Abbreviated Journal IEEE Trans. Appl. Supercond.  
  Volume 21 Issue 3 Pages 267-271  
  Keywords TES, Johnson noise, phonon noise, excess noise, flux-flow noise, thermal fluctuation noise  
  Abstract Microcalorimeters and bolometers are noise-limited devices, therefore, a proper understanding of all noise sources is essential to predict and interpret their performance. In this paper, I review the fundamental noise processes contributing to Transition Edge Sensor (TES) microcalorimeters and bolometers and their effect on device performance. In particular, I will start with a simple, monolithic device model, moving to a more complex one involving discrete components, to finally move to today's more realistic, comprehensive model. In addition to the basic noise contribution (equilibrium Johnson noise and phonon noise), TES are significantly affected by extra noise, which is commonly referred to as excess noise. Different fundamental processes have been proposed and investigated to explain the origin of this excess noise, in particular near equilibrium non-linear Johnson noise, flux-flow noise, and internal thermal fluctuation noise. Experimental evidence shows that all three processes are real and contribute, at different levels, to the TES noise, although different processes become important at different regimes. It is therefore time to discard the term “excess noise” and consider these terms part of the “fundamental noise processes” instead.  
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  Notes Recommended by Klapwijk Approved no  
  Call Number Serial 914  
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Author Zhang, W.; Khosropanah, P.; Gao, J. R.; Kollberg, E. L.; Yngvesson, K. S.; Bansal, T.; Barends, R.; Klapwijk, T. M. openurl 
  Title Quantum noise in a terahertz hot electron bolometer mixer Type Journal Article
  Year (down) 2010 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.  
  Volume 96 Issue 11 Pages 111113-(1-3)  
  Keywords HEB mixer, quantum limit, quantum noise, vacuum box, THz, Terahertz  
  Abstract We have measured the noise temperature of a single, sensitive superconducting NbN hot electron bolometer (HEB) mixer in a frequency range from 1.6 to 5.3 THz, using a setup with all the key components in vacuum. By analyzing the measured receiver noise temperature using a quantum noise (QN) model for HEB mixers, we confirm the effect of QN. The QN is found to be responsible for about half of the receiver noise at the highest frequency in our measurements. The beta-factor (the quantum efficiency of the HEB) obtained experimentally agrees reasonably well with the calculated value.  
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  Notes Approved no  
  Call Number Serial 624  
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Author Ryabchun, S. A.; Tretyakov, I. V.; Finkel, M. I.; Maslennikov, S. N.; Kaurova, N. S.; Seleznev, V. A.; Voronov, B. M.; Gol'tsman, G. N. url  openurl
  Title NbN phonon-cooled hot-electron bolometer mixer with additional diffusion cooling Type Conference Article
  Year (down) 2009 Publication Proc. 20th Int. Symp. Space Terahertz Technol. Abbreviated Journal Proc. 20th ISSTT  
  Volume Issue Pages 151-154  
  Keywords HEB, mixer, bandwidth, noise temperatue, in-situ contacts, in situ contacts  
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  Publisher Place of Publication Charlottesville, USA Editor  
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  Notes Approved no  
  Call Number Serial 590  
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