Author |
Title |
Year |
Publication |
DOI |
Bakhvalova, T.; Belkin, M. E.; Kovalyuk, V. V.; Prokhodtcov, A. I.; Goltsman, G. N.; Sigov, A. S. |
Studying key principles for design and fabrication of silicon photonic-based beamforming networks |
2019 |
PIERS-Spring |
10.1109/PIERS-Spring46901.2019.9017646 |
Polyakova, M.; Semenov, A. V.; Kovalyuk, V.; Ferrari, S.; Pernice, W. H. P.; Gol'tsman, G. N. |
Protocol of measuring hot-spot correlation length for SNSPDs with near-unity detection efficiency |
2019 |
IEEE Trans. Appl. Supercond. |
10.1109/TASC.2019.2906267 |
Prokhodtsov, A.; Golikov, A.; An, P.; Kovalyuk, V.; Goltsman, G.; Arakelyan, S.; Evlyukhin, A.; Kalachev, A.; Naumov, A. |
Effect of silicon oxide coating on a silicon nitride focusing grating coupler efficiency |
2019 |
EPJ Web Conf. |
10.1051/epjconf/201922002009 |
Elmanov, I.; Elmanova, A.; Komrakova, S.; Golikov, A.; Kaurova, N.; Kovalyuk, V.; Goltsman, G.; Arakelyan, S.; Evlyukhin, A.; Kalachev, A.; Naumov, A. |
Method for determination of resists parameters for photonic – integrated circuits e-beam lithography on silicon nitride platform |
2019 |
EPJ Web Conf. |
10.1051/epjconf/201922003012 |
Elmanova, A.; Elmanov, I.; Komrakova, S.; Golikov, A.; Javadzade, J.; Vorobyev, V.; Bolshedvorskii, S.; Soshenko, V.; Akimov, A.; Kovalyuk, V.; Goltsman, G.; Arakelyan, S.; Evlyukhin, A.; Kalachev, A.; Naumov, A. |
Integration of nanodiamonds with NV-centers on optical silicon nitride structures |
2019 |
EPJ Web Conf. |
10.1051/epjconf/201922003013 |