Author |
Title |
Year |
Publication |
Volume |
Pages |
Gershenzon, E. M.; Gol'tsman, G. N.; Mirskii, G. I. |
Submillimeter backward-wave-tube spectrometer-relaxometer |
1987 |
Pribory i Tekhnika Eksperimenta |
30 |
131-137 |
Gershenzon, E. M.; Gol'tsman, G. N.; Karasik, B. S.; Semenov, A. D. |
Measurement of the energy gap in the compound YBaCu3O9-δ on the basis of the IR absorption spectrum |
1987 |
JETP Lett. |
46 |
237-238 |
Gol'tsman, G. N.; Gusinskii, E. N.; Malyavkin, A. V.; Ptitsina, N. G.; Selevko, A. G.; Edel'shtein, V. M. |
The excitonic Zeeman effect in uniaxially-strained germanium |
1987 |
Sov. Phys. JETP |
65 |
1233-1241 |
Gershenzon, E. M.; Gershenzon, M. E.; Gol'tsman, G. N.; Karasik, B. S.; Semenov, A. D.; Sergeev, A. V. |
Light-induced heating of electrons and the time of the inelastic electron-phonon scattering in the YBaCuO compound |
1987 |
JETP Lett. |
46 |
285-287 |
Gershenzon, E. M.; Gol'tsman, G. N.; Ptitsina, N. G.; Riger, E. R. |
Effect of electron-electron collisions on the trapping of free carriers by shallow impurity centers in germanium |
1986 |
Sov. Phys. JETP |
64 |
889-897 |
Gershenzon, E. M.; Gershenzon, M. E.; Gol'tsman, G. N.; Semenov, A. D.; Sergeev, A. V. |
Heating of electrons in a superconductor in the resistive state by electromagnetic radiation |
1984 |
Sov. Phys. JETP |
59 |
442-450 |
Gershenzon, E. M.; Gershenzon, M. E.; Gol'tsman, G. N.; Semyonov, A. D.; Sergeev, A. V. |
Heating of electrons in superconductor in the resistive state due to electromagnetic radiation |
1984 |
Solid State Communications |
50 |
207-212 |
Gershenzon, E. M.; Gol'tsman, G. N.; Multanovskii, V. V.; Ptitsina, N. G. |
Kinetics of electron and hole binding into excitons in germanium |
1983 |
Sov. Phys. JETP |
57 |
369-376 |
Gershenzon, E. M.; Gol'tsman, G. N.; Semenov, A. D. |
Submillimeter backward wave tube spectrometer for measuring superconducting film transmission |
1983 |
Pribory i Tekhnika Eksperimenta |
26 |
134-137 |
Gershenson, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Kagane, M. L.; Multanovskii, V. V.; Ptitsina, N. G. |
Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors |
1983 |
Sov. Phys. Semicond. |
17 |
908-913 |