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Sobolewski, R., Verevkin, A., Gol'tsman, G. N., Lipatov, A., & Wilsher, K. (2003). Ultrafast superconducting single-photon optical detectors and their applications. IEEE Trans. Appl. Supercond., 13(2), 1151–1157.
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Meledin, D., Tong, C. Y. - E., Blundell, R., Kaurova, N., Smirnov, K., Voronov, B., et al. (2003). Study of the IF bandwidth of NbN HEB mixers based on crystalline quartz substrate with an MgO buffer layer. IEEE Trans. Appl. Supercond., 13(2), 164–167.
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Semenov, A. D., Hübers, H. - W., Richter, H., Birk, M., Krocka, M., Mair, U., et al. (2003). Superconducting hot-electron bolometer mixer for terahertz heterodyne receivers. IEEE Trans. Appl. Supercond., 13(2), 168–171.
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Gol'tsman, G. N., & Loudkov, D. N. (2003). Terahertz superconducting hot-electron bolometer mixers and their application in radio astronomy. Radiophys. Quant. Electron., 46(8/9), 604–617.
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Гольцман, Г. Н., & Лудков, Д. Н. (2003). Сверхпроводниковые смесители на горячих электронах терагерцового диапазона и их применение в радиоастрономии. Изв. высших учебных заведений. Радиофизика, 46(8/9).
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Semenov, A., Engel, A., Il'in, K., Gol'tsman, G., Siegel, M., & Hübers, H. - W. (2003). Ultimate performance of a superconducting quantum detector. Eur. Phys. J. Appl. Phys., 21(3), 171–178.
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Tong, C. - Y. E., Meledin, D. V., Marrone, D. P., Paine, S. N., Gibson, H., & Blundell, R. (2003). Near field vector beam measurements at 1 THz. IEEE Microw. Compon. Lett., 13(6), 235–237.
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Zhang, J., Slysz, W., Verevkin, A., Okunev, O., Chulkova, G., Korneev, A., et al. (2003). Response time characterization of NbN superconducting single-photon detectors. IEEE Trans. Appl. Supercond., 13(2), 180–183.
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Meledin, D., Tong, C. - Y. E., Blundell, R., & Goltsman, G. (2003). Measurement of intermediate frequency bandwidth of hot electron bolometer mixers at terahertz frequency range. IEEE Microw. Wireless Compon. Lett., 13(11), 493–495.
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Korneev, A., Lipatov, A., Okunev, O., Chulkova, G., Smirnov, K., Gol’tsman, G., et al. (2003). GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits. Microelectronic Engineering, 69(2-4), 274–278.
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