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Author |
Title |
Year ![sorted by Year field, descending order (down)](img/sort_desc.gif) |
Publication |
DOI |
Links |
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Lipatov, A.; Okunev, O.; Smirnov, K.; Chulkova, G.; Korneev, A.; Kouminov, P.; Gol'tsman, G.; Zhang, J.; Slysz, W.; Verevkin, A.; Sobolewski, R. |
An ultrafast NbN hot-electron single-photon detector for electronic applications |
2002 |
Supercond. Sci. Technol. |
10.1088/0953-2048/15/12/311 |
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Verevkin, A.; Williams, C.; Gol’tsman, G. N.; Sobolewski, R.; Gilbert, G. |
Single-photon superconducting detectors for practical high-speed quantum cryptography |
2001 |
OFCC/ICQI |
10.1364/Icqi.2001.Pa3 |
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Gol’tsman, G.; Okunev, O.; Chulkova, G.; Lipatov, A.; Dzardanov, A.; Smirnov, K.; Semenov, A.; Voronov, B.; Williams, C.; Sobolewski, R. |
Fabrication and properties of an ultrafast NbN hot-electron single-photon detector |
2001 |
IEEE Trans. Appl. Supercond. |
10.1109/77.919410 |
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Verevkin, A.; Xu, Y.; Zheng, X.; Williams, C.; Sobolewski, Roman; Okunev, O.; Smirnov, K.; Chulkova, G.; Korneev, A.; Lipatov, A.; Gol’tsman, G. N. |
Superconducting NbN-based ultrafast hot-electron single-photon detector for infrared range |
2001 |
Proc. 12th Int. Symp. Space Terahertz Technol. |
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Somani, S.; Kasapi, S.; Wilsher, K.; Lo, W.; Sobolewski, R.; Gol’tsman, G. |
New photon detector for device analysis: Superconducting single-photon detector based on a hot electron effect |
2001 |
J. Vac. Sci. Technol. B |
10.1116/1.1412899 |
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Gol’tsman, G. N.; Okunev, O.; Chulkova, G.; Lipatov, A.; Semenov, A.; Smirnov, K.; Voronov, B.; Dzardanov, A.; Williams, C.; Sobolewski, R. |
Picosecond superconducting single-photon optical detector |
2001 |
Appl. Phys. Lett. |
10.1063/1.1388868 |
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Xu, Y.; Zheng, X.; Williams, C.; Verevkin, A.; Sobolewski, R.; Chulkova, G.; Lipatov, A.; Okunev, O.; Smirnov, K.; Gol’tsman, G. N. |
Ultrafast superconducting hot-electron single-photon detector |
2001 |
CLEO |
10.1109/Cleo.2001.947894 |
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Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
10.1016/S0026-2714(00)00137-2 |
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Gupta, D.; Kadin, A. M. |
Single-photon-counting hotspot detector with integrated RSFQ readout electronics |
1999 |
IEEE Trans. Appl. Supercond. |
10.1109/77.784022 |
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Il'in, K. S.; Verevkin, A. A.; Gol'tsman, G. N.; Sobolewski, R. |
Infrared hot-electron NbN superconducting photodetectors for imaging applications |
1999 |
Supercond. Sci. Technol. |
10.1088/0953-2048/12/11/319 |
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