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Il'in KS, Gol'tsman GN, Voronov BM, Sobolewski R. Characterization of the electron energy relaxation process in NbN hot-electron devices. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 390–7.
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Verevkin A, Zhang J, Slysz W, Sobolewski R, Lipatov A, Okunev O, et al. Spectral sensitivity and temporal resolution of NbN superconducting single-photon detectors. In: Proc. 13th Int. Symp. Space Terahertz Technol.; 2002. p. 105–11.
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Verevkin A, Zhang J, Sobolewski R, Lipatov A, Okunev O, Chulkova G, et al. Detection efficiency of large-active-area NbN single-photon superconducting detectors in the ultraviolet to near-infrared range. Appl. Phys. Lett.. 2002;80(25):4687–9.
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Verevkin AA, Zhang J, Slysz W, Sobolewski R, Lipatov AP, Okunev O, et al. Superconducting single-photon detectors for GHz-rate free-space quantum communications. In: Ricklin JC, Voelz DG, editors. Proc. SPIE. Vol 4821. SPIE; 2002. p. 447–54.
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Il'in KS, Currie M, Lindgren M, Milostnaya II, Verevkin AA, Gol'tsman GN, et al. Quantum efficiency and time-domain response of superconducting NbN hot-electron photodetectors. IEEE Trans Appl Supercond. 1999;9(2):3338–41.
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Sobolewski R, Xu Y, Zheng X, Williams C, Zhang J, Verevkin A, et al. Spectral sensitivity of the NbN single-photon superconducting detector. IEICE Trans Electron. 2002;E85-C(3):797–802.
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Korneeva YP, Manova NN, Dryazgov MA, Simonov NO, Zolotov PI, Korneev AA. Influence of sheet resistance and strip width on the detection efficiency saturation in micron-wide superconducting strips and large-area meanders. Supercond Sci Technol. 2021;34(8):084001.
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Zhang J, Slysz W, Verevkin A, Okunev O, Chulkova G, Korneev A, et al. Response time characterization of NbN superconducting single-photon detectors. IEEE Trans. Appl. Supercond.. 2003;13(2):180–3.
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Seki T, Shibata H, Takesue H, Tokura Y, Imoto N. Comparison of timing jitter between NbN superconducting single-photon detector and avalanche photodiode. Phys C. 2010;470(20):1534–7.
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Zolotov PI, Divochiy AV, Vakhtomin YB, Lubenchenko AV, Morozov PV, Shurkaeva IV, et al. Influence of sputtering parameters on the main characteristics of ultra-thin vanadium nitride films. In: J. Phys.: Conf. Ser. Vol 1124.; 2018. 051030.
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