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Il'in KS, Gol'tsman GN, Voronov BM, Sobolewski R. Characterization of the electron energy relaxation process in NbN hot-electron devices. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 390–7.
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Semenov AD, Gousev YP, Nebosis RS, Renk KF, Yagoubov P, Voronov BM, et al. Heterodyne detection of THz radiation with a superconducting hot‐electron bolometer mixer. Appl Phys Lett. 1996;69(2):260–2.
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Semenov A, Richter H, Hübers H-W, Petrenko D, Tretyakov I, Ryabchun S, et al. Optimization of the intermediate frequency bandwidth in the THz HEB mixers [abstract]. In: Proc. 25th Int. Symp. Space Terahertz Technol.; 2014. 54.
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Antipov S, Trifonov A, Krause S, Meledin D, Kaurova N, Rudzinski M, et al. Improved bandwidth of a 2 THz hot-electron bolometer heterodyne mixer fabricated on sapphire with a GaN buffer layer. Supercond Sci Technol. 2019;32(7):075003.
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Hübers H-W, Semenov A, Schubert J, Gol'tsman G, Voronov B, Gershenzon E. Performance of the phonon-cooled hot-electron bolometric mixer between 0.7 THz and 5.2 THz. In: Proc. 8-th Int. Conf. on Terahertz Electronics.; 2000. p. 117–9.
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Sidorova M, Semenov AD, Hübers H-W, Ilin K, Siegel M, Charaev I, et al. Electron energy relaxation in disordered superconducting NbN films. Phys Rev B. 2020;102(5):054501 (1 to 15).
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Pearlman A, Cross A, Slysz W, Zhang J, Verevkin A, Currie M, et al. Gigahertz counting rates of NbN single-photon detectors for quantum communications. IEEE Trans Appl Supercond. 2005;15(2):579–82.
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Trifonov A, Tong C-YE, Grimes P, Lobanov Y, Kaurova N, Blundell R, et al. Development of a silicon membrane-based multipixel hot electron bolometer receiver. IEEE Trans Appl Supercond. 2017;27(4):1–5.
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Ren Y, Zhang DX, Zhou KM, Miao W, Zhang W, Shi SC, et al. 10.6 μm heterodyne receiver based on a superconducting hot-electron bolometer mixer and a quantum cascade laser. AIP Advances. 2019;9(7):075307.
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Sclafani M, Marksteiner M, Keir FML, Divochiy A, Korneev A, Semenov A, et al. Sensitivity of a superconducting nanowire detector for single ions at low energy. Nanotechnol. 2012;23(6):065501 (1 to 5).
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