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Author
Swetz, D. S.
;
Bennett, D. A.
;
Irwin, K. D.
;
Schmidt, D. R.
;
Ullom, J. N.
Title
Current distribution and transition width in superconducting transition-edge sensors
Type
Journal Article
Year
2012
Publication
Appl. Phys. Lett.
Abbreviated Journal
Appl. Phys. Lett.
Volume
101
Issue
Pages
242603
Keywords
Abstract
Present models of the superconducting-to-normal transition in transition-edge sensors (TESs) do not describe the current distribution within a biased TES. This distribution is complicated by normal-metal features that are integral to TES design. We present a model with one free parameter that describes the evolution of the current distribution with bias. To probe the current distribution experimentally, we fabricated TES devices with different current return geometries. Devices where the current return geometry mirrors current flow within the device have sharper transitions, thus allowing for a direct test of the current-flow model.Measurements from these devices show that current meanders through a TES low in the resistivetransition but flows across the normal-metal features by 40% of the normal-state resistance. Comparison of transition sharpness between device designs reveals that self-induced magnetic fields play an important role in determining the width of the superconducting transition.
Address
TES, current distribution
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Recommended by Klapwijk
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no
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Serial
930
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