toggle visibility Search & Display Options

Select All    Deselect All
 | 
Citations
 | 
Il'in K, Siegel M, Semenov A, Engel A, Hübers H-W, Hollmann E, et al. Thickness dependence of superconducting properties of ultrathin Nb and NbN films. In: AKF-Frühjahrstagung.; 2004.
toggle visibility
Select All    Deselect All
 | 
Citations
 |