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Gershenzon EM, Gol'tsman GN, Semenov AD, Sergeev AV. Mechanism of picosecond response of granular YBaCuO films to electromagnetic radiation. Solid State Communications. 1990;76(4):493–7.
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Gershenzon EM, Gol’tsman GN, Semenov AD, Sergeev AV. Mechanism of picosecond response of granular YBaCuO films to electromagnetic radiation. IEEE Trans Magn. 1991;27(2):1321–4.
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Gershenzon EM, Gol’tsman GN, Sergeev A, Semenov AD. Picosecond response of YBaCuO films to electromagnetic radiation. In: Gorzkowski W, Gutowski M, Reich A, Szymczak H, editors. Proc. European Conf. High-Tc Thin Films and Single Crystals.; 1990. p. 457–62.
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Gershenzon E, Gershenzon ME, Gol'tsman GN, Semenov AD, Sergeev AV. Heating of quasiparticles in a superconducting film in the resistive state. JETP Lett. 1981;34(5):268–71.
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Gol’tsman GN, Semenov AD, Sergeev AV, Aksaev EE, Gogidze IG, Gershenzon EM. Electron-phonon interaction in thin YBaCuO films and fast detectors. In: Meissner M, Pohl RO, editors. Phonon Scattering in Condensed Matter VII. Springer Series in Solid-State Sciences. Vol 112.; 1993. p. 184–5.
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Gousev YP, Semenov AD, Gol'tsman GN, Sergeev AV, Gershenzon EM. Electron-phonon interaction in disordered NbN films. Phys B Condens Mat. 1994;194-196:1355–6.
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Il'in KS, Karasik BS, Ptitsina NG, Sergeev AV, Gol'tsman GN, Gershenzon EM, et al. Electron-phonon-impurity interference in thin NbC films: electron inelastic scattering time and corrections to resistivity. In: Czech. J. Phys. Vol 46.; 1996. p. 857–8.
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Il’in KS, Ptitsina NG, Sergeev AV, Gol’tsman GN, Gershenzon EM, Karasik BS, et al. Interrelation of resistivity and inelastic electron-phonon scattering rate in impure NbC films. Phys Rev B. 1998;57(24):15623–8.
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Kitaygorsky J, Zhang J, Verevkin A, Sergeev A, Korneev A, Matvienko V, et al. Origin of dark counts in nanostructured NbN single-photon detectors. IEEE Trans Appl Supercond. 2005;15(2):545–8.
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Men’shchikov EM, Gogidze IG, Sergeev AV, Elant’ev AI, Kuminov PB, Gol’tsman GN, et al. Superconducting fast detector based on the nonequilibrium inductance response of a film of niobium nitride. Tech Phys Lett. 1997;23(6):486–8.
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