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Korneeva Y, Florya I, Vdovichev S, Moshkova M, Simonov N, Kaurova N, et al. Comparison of hot spot formation in nbn and mon thin superconducting films after photon absorption. IEEE Trans Appl Supercond. 2017;27(4):1–4.
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Korneeva Y, Sidorova M, Semenov A, Krasnosvobodtsev S, Mitsen K, Korneev A, et al. Comparison of hot-spot formation in NbC and NbN single-photon detectors. IEEE Trans Appl Supercond. 2016;26(3):1–4.
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Korneeva Y, Vodolazov D, Florya I, Manova N, Smirnov E, Korneev A, et al. Single photon detection in micron scale NbN and α-MoSi superconducting strips. In: EPJ Web Conf. Vol 190.; 2018. 04010 (1 to 2).
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Korneeva Y P, Vodolazov D Y, Semenov AV, Florya IN, Simonov N, Baeva E, et al. Optical single photon detection in micron-scaled NbN bridges [Internet].; 2018 [cited 2024 Jul 1].arXiv:1802.02881v1 [cond-mat.supr-con]. Available from: https://arxiv.org/abs/1802.02881v1
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Korneeva Y P, Vodolazov D Y, Semenov A V, Florya I N, Simonov N, Baeva E, et al. Optical single-photon detection in micrometer-scale NbN bridges. Phys Rev Applied. 2018;9(6):064037 (1 to 13).
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Kovalyuk V, Ferrari S, Kahl O, Semenov A, Lobanov Y, Shcherbatenko M, et al. Waveguide integrated superconducting single-photon detector for on-chip quantum and spectral photonic application. In: J. Phys.: Conf. Ser. Vol 917.; 2017. 062032.
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Kovalyuk V, Ferrari S, Kahl O, Semenov A, Shcherbatenko M, Lobanov Y, et al. On-chip coherent detection with quantum limited sensitivity. Sci Rep. 2017;7(1):4812.
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Kovalyuk V, Hartmann W, Kahl O, Kaurova N, Korneev A, Goltsman G, et al. Absorption engineering of NbN nanowires deposited on silicon nitride nanophotonic circuits. Opt Express. 2013;21(19):22683–92.
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Kovalyuk V, Kahl O, Ferrari S, Vetter A, Lewes-Malandrakis G, Nebel C, et al. On-chip single-photon spectrometer for visible and infrared wavelength range. In: J. Phys.: Conf. Ser. Vol 1124.; 2018. 051045.
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Lipatov A, Okunev O, Smirnov K, Chulkova G, Korneev A, Kouminov P, et al. An ultrafast NbN hot-electron single-photon detector for electronic applications. Supercond Sci Technol. 2002;15(12):1689–92.
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