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Hübers H-W, Schubert J, Krabbe A, Birk M, Wagner G, Semenov A, et al. Parylene anti-reflection coating of a quasi-optical hot-electron-bolometric mixer at terahertz frequencies. Infrared Physics & Technology. 2001;42(1):41–7.
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Darula M, Semenov AD, Hübers H-W, Schubert J. Quasioptical high-Tc superconductor Josephson mixer at terahertz frequencies [abstract]. In: Proc. 11th Int. Symp. Space Terahertz Technol.; 2000. 515.
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Yagoubov P, Kroug M, Merkel H, Kollberg E, Schubert J, Hubers H-W, et al. Heterodyne measurements of a NbN superconducting hot electron mixer at terahertz frequencies. IEEE Trans Appl Supercond. 1999;9(2):3757–60.
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Schubert J, Semenov A, Gol'tsman G, Hübers H-W, Schwaab G, Voronov B, et al. Noise temperature and sensitivity of a NbN hot-electron mixer at frequencies from 0.7 THz to 5.2 THz. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 190–9.
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Yagoubov P, Kroug M, Merkel H, Kollberg E, Hübers H-W, Schubert J, et al. NbN hot electron bolometric mixers at frequencies between 0.7 and 3.1 THz. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 238–46.
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Schwaab GW, Hübers H-W, Schubert J, Erichsen P, Gol'tsman G, Semenov A, et al. A high resolution spectrometer for the investigation of molecular structures in the THZ range. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 530–8.
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Lindgren M, Currie M, Zeng W-S, Sobolewski R, Cherednichenko S, Voronov B, et al. Picosecond response of a superconducting hot-electron NbN photodetector. Appl Supercond. 1998;6(7-9):423–8.
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Kawamura J, Blundell R, Tong C-yu E, Gol’tsman G, Gershenzon E, Voronov B, et al. Low noise NbN lattice-cooled superconducting hot-electron bolometric mixers at submillimeter wavelengths. Appl Phys Lett. 1997;70(12):1619–21.
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Kawamura J, Blundell R, Tong C-YE, Gol'tsman G, Gershenzon E, Voronov B. NbN hot-electron mixer measurements at 200 GHz. In: Proc. 6th Int. Symp. Space Terahertz Technol.; 1995. p. 254–61.
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Гершензон ЕМ, Грачев СА, Литвак-Горская ЛБ. Механизм преобразования частоты в n-InSb-смесителе. Физика и техника полупроводников. 1991;25(11):1986–98.
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