| |
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Korneeva, Y. P.; Mikhailov, M. Y.; Pershin, Y. P.; Manova, N. N.; Divochiy, A. V.; Vakhtomin, Y. B.; Korneev, A. A.; Smirnov, K. V.; Sivakov, A. G.; Devizenko, A. Y.; Goltsman, G. N. |
Superconducting single-photon detector made of MoSi film |
2014 |
Supercond. Sci. Technol. |
27 |
095012 |
|
|
|
Takemoto, K.; Nambu, Y.; Miyazawa, T.; Sakuma, Y.; Yamamoto, T.; Yorozu, S.; Arakawa, Y. |
Quantum key distribution over 120 km using ultrahigh purity single-photon source and superconducting single-photon detectors |
2015 |
Sci. Rep. |
5 |
14383 |
|
|
|
Korneev, A.; Divochiy, A.; Tarkhov, M.; Minaeva, O.; Seleznev, V.; Kaurova, N.; Voronov, B.; Okunev, O.; Chulkova, G.; Milostnaya, I.; Smirnov, K.; Gol’tsman, G. |
Superconducting NbN-nanowire single-photon detectors capable of photon number resolving |
2008 |
Supercond. News Forum |
|
|
|
|
|
Sidorova, Maria V.; Divochiy, Alexander V.; Vakhtomin, Yury B.; Smirnov, Konstantin V. |
Ultrafast superconducting single-photon detector with a reduced active area coupled to a tapered lensed single-mode fiber |
2015 |
J. Nanophoton. |
9 |
093051 |
|
|
|
Ozhegov, R.; Elezov, M.; Kurochkin, Y.; Kurochkin, V.; Divochiy, A.; Kovalyuk, V.; Vachtomin, Y.; Smirnov, K.; Goltsman, G. |
Quantum key distribution over 300 |
2014 |
Proc. SPIE |
9440 |
1F (1 to 9) |
|
|
|
Smirnov, K. V.; Vakhtomin, Yu. B.; Divochiy, A. V.; Ozhegov, R. V.; Pentin, I. V.; Slivinskaya, E. V.; Tarkhov, M. A.; Gol’tsman, G. N. |
Single-photon detectors for the visible and infrared parts of the spectrum based on NbN nanostructures |
2009 |
Proc. Progress In Electromagnetics Research Symp. |
|
863-864 |
|
|
|
McCarthy, Aongus; Krichel, Nils J.; Gemmell, Nathan R.; Ren, Ximing; Tanner, Michael G.; Dorenbos, Sander N.; Zwiller, Val; Hadfield, Robert H.; Buller, Gerald S. |
Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detection |
2013 |
Opt. Express |
21 |
8904-8915 |
|
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
|
|
|
Stellari, Franco; Song, Peilin |
Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) |
2005 |
Proc. 12th IPFA |
|
2 |
|
|
|
Marsili, F.; Verma, V. B.; Stern, J. A.; Harrington, S.; Lita, A. E.; Gerrits, T.; Vayshenker, I.; Baek, B.; Shaw, M. D.; Mirin, R. P.; Nam, S. W. |
Detecting single infrared photons with 93% system efficiency |
2013 |
Nat. Photon. |
7 |
210-214 |
|
