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Author
Bennett, Douglas A.
;
Schmidt, Daniel R.
;
Swetz, Daniel S.
;
Ullom, Joel N.
Title
Phase-slip lines as a resistance mechanism in transition-edge sensors
Type
Journal Article
Year
2014
Publication
Appl. Phys. Lett.
Abbreviated Journal
Appl. Phys. Lett.
Volume
104
Issue
Pages
042602
Keywords
microbolometers, TES, phase-slip lines, PSL
Abstract
The fundamental mechanism of resistance in voltage-biased superconducting films is poorly understood despite its importance as the basis of transition-edge sensors (TESs). TESs are utilized in state-of-the-art microbolometers and microcalorimeters covering a wide range of energies and applications. We present a model for the resistance of a TES based on phase-slip lines (PSLs) and compare the model to data. One of the model's predictions, discrete changes in the number of PSLs, is a possible explanation for the observed switching between discrete current states in localized regions of bias.
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Recommended by Klapwijk
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no
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929
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