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Gershenzon EM, Gol'tsman GN, Multanovskii VV, Ptitsina NG. Kinetics of electron and hole binding into excitons in germanium. Sov Phys JETP. 1983;57(2):369–76.
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Goltsman GN, Maliavkin AV, Ptitsina NG, Selevko AG. Magnetic exciton spectroscopy in uniaxially compressed Ge at submillimeter waves. In: Izv. Akad. Nauk SSSR, Seriya Fizicheskaya. Vol 50.; 1986. p. 280–1.
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Ptitsina NG, Chulkova GM, Gershenzon EM. Influence of the interference of electron-phonon and electron-impurity scattering on the conductivity of unordered Nb films. JETP. 1995;80(5):960–4.
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Verevkin A, Gershenzon EM, Gol'tsman GN, Ptitsina NG, Chulkova GM, Smirnov KS, et al. Direct measurements of energy relaxation times in two-dimensional structures under quasi-equilibrium conditions. In: Mater. Sci. Forum. Vol 384-3.; 2002. p. 107–16.
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Smirnov KV, Ptitsina NG, Vakhtomin YB, Verevkin AA, Gol’tsman GN, Gershenzon EM. Energy relaxation of two-dimensional electrons in the quantum Hall effect regime. JETP Lett. 2000;71(1):31–4.
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Verevkin AA, Ptitsina NG, Smirnov KV, Voronov BM, Gol’tsman GN, Gershenson EM, et al. Multiple Andreev reflection in hybrid AlGaAs/GaAs structures with superconducting NbN contacts. Semicond. 1999;33(5):551–4.
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Karasik BS, Il'in KS, Ptitsina NG, Gol'tsman GN, Gershenzon EM, Pechen' EV, et al. Electron-phonon scattering rate in impure NbC films [abstract]. In: NASA/ADS.; 1998. Y35.08.
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Verevkin AA, Ptitsina NG, Smirnov KV, Goltsman GN, Gershenson EM, Yngvesson KS. Direct measurements of electron energy relaxation times at an AlGaAs/GaAs heterointerface in the optical phonon scattering range. In: Proc. 4-th Int. Semicond. Device Research Symp.; 1997. p. 55–8.
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Verevkin AA, Ptitsina NG, Smirnov KV, Gol'tsman GN, Voronov BM, Gershenzon EM, et al. Hot electron bolometer detectors and mixers based on a superconducting-two-dimensional electron gas-superconductor structure. In: Proc. 4-th Int. Semicond. Device Research Symp.; 1997. p. 163–6.
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Verevkin AA, Ptitsina NG, Smirnov KV, Gol’tsman GN, Gershenzon EM, Ingvesson KS. Direct measurements of energy relaxation times on an AlGaAs/GaAs heterointerface in the range 4.2–50 K. JETP Lett. 1996;64(5):404–9.
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