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Gerecht E, Musante CF, Zhuang Y, Yngvesson KS, Gol’tsman GN, Voronov BM, et al. NbN hot electron bolometric mixerss—a new technology for low-noise THz receivers. IEEE Trans Appl Supercond. 1999;47(12):2519–27.
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Gerecht E, Musante CF, Jian H, Yngvesson KS, Dickinson J, Waldman J, et al. New results for NbN phonon-cooled hot electron bolometric mixers above 1 THz. IEEE Trans Appl Supercond. 1999;9(2):4217–20.
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Verevkin AA, Ptitsina NG, Smirnov KV, Voronov BM, Gol’tsman GN, Gershenson EM, et al. Multiple Andreev reflection in hybrid AlGaAs/GaAs structures with superconducting NbN contacts. Semicond. 1999;33(5):551–4.
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Gerecht E, Musante CF, Jian H, Zhuang Y, Yngvesson KS, Dickinson J, et al. Improved characteristics of NbN HEB mixers integrated with log-periodic antennas. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 200–7.
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Il'in KS, Gol'tsman GN, Voronov BM, Sobolewski R. Characterization of the electron energy relaxation process in NbN hot-electron devices. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 390–7.
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Blundell R, Kawamura JH, Tong CE, Papa DC, Hunter TR, Gol’tsman GN, et al. A hot-electron bolometer mixer receiver for the 680-830 GHz frequency range. In: Proc. 6-th Int. Conf. Terahertz Electron. IEEE; 1998. p. 18–20.
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Gousev YP, Olsson HK, Gol'tsman GN, Voronov BM, Gershenzon EM. NbN hot-electron mixer at radiation frequencies between 0.9 THz and 1.2 THz. In: Proc. 9th Int. Symp. Space Terahertz Technol.; 1998. p. 121–9.
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Semenov AD, Gousev YP, Renk KF, Voronov BM, Gol'tsman GN, Gershenzon EM, et al. Noise characteristics of a NbN hot-electron mixer at 2.5 THz. IEEE Trans Appl Supercond. 1997;7(2):3572–5.
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Svechnikov SI, Okunev OV, Yagoubov PA, Gol'tsman GN, Voronov BM, Cherednichenko SI, et al. 2.5 THz NbN hot electron mixer with integrated tapered slot antenna. IEEE Trans Appl Supercond. 1997;7(2):3548–51.
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Gerecht E, Musante CF, Yngvesson KS, Waldman J, Gol'tsman GN, Yagoubov PA, et al. Optical coupling and conversion gain for NbN HEB mixer at THz frequencies. In: Proc. 4-th Int. Semicond. Device Research Symp.; 1997. p. 47–50.
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