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Gershenzon EM, Gershenson ME, Goltsman GN, Karasik BS, Lyulkin AM, Semenov AD. Fast-response superconducting electron bolometer. Pisma v Zhurnal Tekhnicheskoi Fiziki. 1989;15(3):88–92.
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Gershenzon EM, Gol'tsman GN, Zorin MA, Karasik BS, Trifonov VA. Nonequilibrium and bolometric response of YBaCuO films in a resistive state to infrared low intensity radiation. In: Council on Low-temp. Phys.; 1994. p. 82–3.
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Gol’tsman GN, Kouminov PB, Goghidze IG, Karasik BS, Gershenzon EM. Nonbolometric and fast bolometric responses of YBaCuO thin films in superconducting, resistive, and normal states. In: Nahum M, Villegier J-C, editors. Proc. SPIE. Vol 2159. SPIE; 1994. p. 81–6.
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Karasik BS, Zorin MA, Milostnaya II, Elantev AI, Gol’tsman GN, Gershenzon EM. Evidence of subnanosecond transition stage in S-N current switching of YBaCuO films. In: Buhrman RA, Clarke JT, Daly K, Koch RH, Luine JA, Simon RW, editors. Proc. SPIE. Vol 2160. SPIE; 1994. p. 74–82.
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Gershenzon EM, Gol'tsman GN. Transitions of electrons between excited states of donors in germanium. JETP Lett. 1971;14(2):63–5.
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Gerecht E, Musante CF, Yngvesson KS, Waldman J, Gol'tsman GN, Yagoubov PA, et al. Optical coupling and conversion gain for NbN HEB mixer at THz frequencies. In: Proc. 4-th Int. Semicond. Device Research Symp.; 1997. p. 47–50.
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Mel’nikov AP, Gurvich YA, Shestakov LN, Gershenzon EM. Magnetic field effects on the nonohmic impurity conduction of uncompensated crystalline silicon. Jetp Lett. 2001;73(1):44–7.
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Semenov AD, Hübers H–W, Schubert J, Gol'tsman GN, Elantiev AI, Voronov BM, et al. Frequency dependent noise temperature of the lattice cooled hot-electron terahertz mixer. In: Proc. 11th Int. Symp. Space Terahertz Technol.; 2000. p. 39–48.
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Karasik BS, Il'in KS, Ptitsina NG, Gol'tsman GN, Gershenzon EM, Pechen' EV, et al. Electron-phonon scattering rate in impure NbC films [abstract]. In: NASA/ADS.; 1998. Y35.08.
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Smirnov KV, Ptitsina NG, Vakhtomin YB, Verevkin AA, Gol’tsman GN, Gershenzon EM. Energy relaxation of two-dimensional electrons in the quantum Hall effect regime. JETP Lett. 2000;71(1):31–4.
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