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Semenov AD, Heusinger MA, Renk KF, Menschikov E, Sergeev AV, Elant'ev AI, et al. Influence of phonon trapping on the performance of NbN kinetic inductance detectors. IEEE Trans Appl Supercond. 1997;7(2):3083–6.
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Gol'tsman GN, Karasik BS, Okunev OV, Dzardanov AL, Gershenzon EM, Ekstrom H, et al. NbN hot electron superconducting mixers for 100 GHz operation. IEEE Trans Appl Supercond. 1995;5(2):3065–8.
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Karasik BS, Milostnaya II, Zorin MA, Elantev AI, Gol'tsman GN, Gershenzon EM. High speed current switching of homogeneous YBaCuO film between superconducting and resistive states. IEEE Trans Appl Supercond. 1995;5(2):3042–5.
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Gorokhov G, Bychanok D, Gayduchenko I, Rogov Y, Zhukova E, Zhukov S, et al. THz spectroscopy as a versatile tool for filler distribution diagnostics in polymer nanocomposites. Polymers (Basel). 2020;12(12):3037 (1 to 14).
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Lindgren M, Trifonov V, Zorin M, Danerud M, Winkler D, Karasik BS, et al. Transient resistive photoresponse of YBa2Cu3O7−δ films using low power 0.8 and 10.6 μm laser radiation. Appl Phys Lett. 1994;64(22):3036–8.
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Elmanova A, Elmanov I, Komrakova S, Golikov A, Javadzade J, Vorobyev V, et al. Integration of nanodiamonds with NV-centers on optical silicon nitride structures. In: EPJ Web Conf. Vol 220.; 2019. 03013.
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Elmanov I, Elmanova A, Komrakova S, Golikov A, Kaurova N, Kovalyuk V, et al. Method for determination of resists parameters for photonic – integrated circuits e-beam lithography on silicon nitride platform. In: EPJ Web Conf. Vol 220.; 2019. 03012.
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Elezov M, Scherbatenko M, Sych D, Goltsman G, Arakelyan S, Evlyukhin A, et al. Towards the fiber-optic Kennedy quantum receiver. In: EPJ Web Conf. Vol 220.; 2019. 03011 (1 to 2).
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Semenov A, Richter H, Hübers H-W, Smirnov K, Voronov B, Gol'tsman G. Development of terahertz superconducting hot-electron bolometer mixers. In: Proc. 6th European Conf. Appl. Supercond. Vol 181.; 2003. p. 2960–5.
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Jiang L, Miao W, Zhang W, Li N, Lin ZH, Yao QJ, et al. Characterization of a quasi-optical NbN superconducting HEB mixer. IEEE Trans Microwave Theory Techn. 2006;54(7):2944–8.
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