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Ryabchun SA, Tretyakov IV, Pentin IV, Kaurova NS, Seleznev VA, Voronov BM, et al. Low-noise wide-band hot-electron bolometer mixer based on an NbN film. Radiophys. Quant. Electron.. 2009;52(8):576–82.
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Pearlman A, Cross A, Slysz W, Zhang J, Verevkin A, Currie M, et al. Gigahertz counting rates of NbN single-photon detectors for quantum communications. IEEE Trans Appl Supercond. 2005;15(2):579–82.
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Hubers H-W, Semenov A, Richter H, Schwarz M, Gunther B, Smirnov K, et al. Heterodyne receiver for 3-5 THz with hot-electron bolometer mixer. In: Zmuidzinas J, Holland WS, Withington S, editors. Proc. SPIE. Vol 5498. SPIE; 2004. p. 579–86.
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Gerecht E, Musante CF, Wang Z, Yngvesson KS, Mueller ER, Waldman J, et al. Optimization of hot eleciron bolometer mixing efficiency in NbN at 119 micrometer wavelength. In: Proc. 7th Int. Symp. Space Terahertz Technol.; 1996. p. 584–600.
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Jiang L, Zhang W, Yao QJ, Lin ZH, Li J, Shi SC, et al. Characterization of a quasi-optical NbN superconducting hot-electron bolometer mixer. In: Proc. PIERS. Vol 1.; 2005. p. 587–90.
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Milostnaya I, Korneev A, Tarkhov M, Divochiy A, Minaeva O, Seleznev V, et al. Superconducting single photon nanowire detectors development for IR and THz applications. J Low Temp Phys. 2008;151(1-2):591–6.
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Tretyakov IV, Finkel MI, Ryabchun SA, Kardakova AI, Seliverstov SV, Petrenko DV, et al. Hot-electron bolometer mixers with in situ contacts. Radiophys Quant Electron. 2014;56(8-9):591–8.
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Verevkin AI, Ptitsina NG, Chulkova GM, Gol'tsman GN, Gershenzon EM, Yngvesson KS. Electron energy relaxation in a 2D channel in AlGaAs-GaAs heterostructures under quasiequilibrium conditions at low temperatures. JETP Lett. 1995;61(7):591–5.
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Antipov SV, Vachtomin YB, Maslennikov SN, Smirnov KV, Kaurova NS, Grishina EV, et al. Noise performance of quasioptical ultrathin NbN hot electron bolometer mixer at 2.5 and 3.8 THz. In: Proc. 5-th MSMW. Vol 2. Kharkov, Ukraine; 2004. p. 592–4.
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Zhang J, Pearlman A, Slysz W, Verevkin A, Sobolewski R, Wilsher K, et al. A superconducting single-photon detector for CMOS IC probing. In: Proc. 16-th LEOS. Vol 2.; 2003. p. 602–3.
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