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Kawamura J, Tong C-YE, Blundell R, Papa DC, Hunter TR, Patt F, et al. Terahertz-frequency waveguide NbN hot-electron bolometer mixer. IEEE Trans Appl Supercond. 2001;11(1):952–4.
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Jukna A, Kitaygorsky J, Pan D, Cross A, Perlman A, Komissarov I, et al. Dynamics of hotspot formation in nanostructured superconducting stripes excited with single photons. Acta Physica Polonica A. 2008;113(3):955–8.
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Voronov BM, Gershenzon EM, Gol'tsman GN, Gogidze IG, Gusev YP, Zorin MA, et al. Picosecond range detector base on superconducting niobium nitride film sensitive to radiation in spectral range from millimeter waves up to visible light. Sverkhprovodimost': Fizika, Khimiya, Tekhnika. 1992;5(5):955–60.
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Ptitsina NG, Chulkova GM, Gershenzon EM. Influence of the interference of electron-phonon and electron-impurity scattering on the conductivity of unordered Nb films. JETP. 1995;80(5):960–4.
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Kroug M, Cherednichenko S, Merkel H, Kollberg E, Voronov B, Gol'tsman G, et al. NbN hot electron bolometric mixers for terahertz receivers. IEEE Trans Appl Supercond. 2001;11(1):962–5.
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Финкель МИ, Масленников СН, Гольцман ГН. Супергетеродинные терагерцовые приёмники со сверхпроводниковым смесителем на электронном разогреве. Известия высших учебных заведений. Радиофизика. 2005;48(10):964–70.
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Tikhonov VV, Polyakova ON, Gol’tsman GN, Dzardanov AL, Boyarskiy DA. Determination of dielectric properties of ore minerals in the microwave band. Radiophys Quant Electron. 2008;51(12):966–74.
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Polyakova ON, Tikhonov VV, Dzardanov AL, Boyarskii DA, Gol’tsman GN. Dielectric characteristics of ore minerals in a 10–40 GHz frequency range. Tech Phys Lett. 2008;34(11):967–70.
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Pentin IV, Smirnov AV, Ryabchun SA, Ozhegov RV, Gol’tsman GN, Vaks VL, et al. Semiconducting superlattice as a solid-state terahertz local oscillator for NbN hot-electron bolometer mixers. Tech Phys. 2012;57(7):971–4.
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Cherednichenko S, Yagoubov P, Il'in K, Gol'tsman G, Gershenzon E. Large bandwidth of NbN phonon-cooled hot-electron bolometer mixers. In: Proc. 27th Eur. Microwave Conf. Vol 2. IEEE; 1997. p. 972–7.
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