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Florya IN, Korneeva YP, Sidorova MV, Golikov AD, Gaiduchenko IA, Fedorov GE, et al. Energy relaxtation and hot spot formation in superconducting single photon detectors SSPDs. In: EPJ Web of Conferences. Vol 103.; 2015. 10004 (1 to 2).
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Lusche R, Semenov A, Ilin K, Siegel M, Korneeva Y, Trifonov A, et al. Effect of the wire width on the intrinsic detection efficiency of superconducting-nanowire single-photon detectors. J Appl Phys. 2014;116(4):043906 (1 to 9).
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Kovalyuk V, Ferrari S, Kahl O, Semenov A, Lobanov Y, Shcherbatenko M, et al. Waveguide integrated superconducting single-photon detector for on-chip quantum and spectral photonic application. In: J. Phys.: Conf. Ser. Vol 917.; 2017. 062032.
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Korneev A, Kovalyuk V, Ferrari S, Kahl O, Pernice W, An P, et al. Superconducting Single-Photon Detectors for Integrated Nanophotonics Circuits. In: 16th ISEC.; 2017. p. 1–3.
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Zubkova E, An P, Kovalyuk V, Korneev A, Ferrari S, Pernice W, et al. Integrated Bragg waveguides as an efficient optical notch filter on silicon nitride platform. In: J. Phys.: Conf. Ser. Vol 917.; 2017. 062042.
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Bandurin DA, Svintsov D, Gayduchenko I, Xu SG, Principi A, Moskotin M, et al. Resonant terahertz detection using graphene plasmons. Nat Commun. 2018;9:5392 (1 to 8).
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Tretyakov I, Shurakov A, Perepelitsa A, Kaurova N, Svyatodukh S, Zilberley T, et al. Room temperature silicon detector for IR range coated with Ag2S quantum dots. Phys Status Solidi RRL. 2019;13(9):1900187–(1.
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Shurakov A, Mikhailov D, Belikov I, Kaurova N, Zilberley T, Prikhodko A, et al. Planar Schottky diode with a Γ-shaped anode suspended bridge. In: J. Phys.: Conf. Ser. Vol 1695.; 2020. 012154.
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Shurakov A, Prikhodko A, Mikhailov D, Belikov I, Kaurova N, Voronov B, et al. Efficiency of a microwave reflectometry for readout of a THz multipixel Schottky diode direct detector. In: J. Phys.: Conf. Ser. Vol 1695.; 2020. 012156.
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Shurakov A, Lobanov Y, Goltsman G. Superconducting hot-electron bolometer: from the discovery of hot-electron phenomena to practical applications. Supercond Sci Technol. 2015;29(2):023001.
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