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Semenov AD, Gousev YP, Renk KF, Voronov BM, Gol'tsman GN, Gershenzon EM, et al. Noise characteristics of a NbN hot-electron mixer at 2.5 THz. IEEE Trans Appl Supercond. 1997;7(2):3572–5.
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Svechnikov SI, Okunev OV, Yagoubov PA, Gol'tsman GN, Voronov BM, Cherednichenko SI, et al. 2.5 THz NbN hot electron mixer with integrated tapered slot antenna. IEEE Trans Appl Supercond. 1997;7(2):3548–51.
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Zorin M, Milostnaya I, Gol'tsman GN, Gershenzon EM. Fast NbN superconducting switch controlled by optical radiation. IEEE Trans Appl Supercond. 1997;7(2):3734–7.
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Svechnikov S, Gol'tsman G, Voronov B, Yagoubov P, Cherednichenko S, Gershenzon E, et al. Spiral antenna NbN hot-electron bolometer mixer at submm frequencies. IEEE Trans Appl Supercond. 1997;7(2):3395–8.
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Semenov AD, Heusinger MA, Renk KF, Menschikov E, Sergeev AV, Elant'ev AI, et al. Influence of phonon trapping on the performance of NbN kinetic inductance detectors. IEEE Trans Appl Supercond. 1997;7(2):3083–6.
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Karasik BS, Gol'tsman GN, Voronov BM, Svechnikov SI, Gershenzon EM, Ekstrom H, et al. Hot electron quasioptical NbN superconducting mixer. IEEE Trans Appl Supercond. 1995;5(2):2232–5.
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Pentin IV, Smirnov AV, Ryabchun SA, Ozhegov RV, Gol’tsman GN, Vaks VL, et al. Semiconducting superlattice as a solid-state terahertz local oscillator for NbN hot-electron bolometer mixers. Tech Phys. 2012;57(7):971–4.
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Tret’yakov IV, Ryabchun SA, Kaurova NS, Larionov PA, Lobastova AA, Voronov BM, et al. Optimum absorbed heterodyne power for superconducting NbN hot-electron bolometer mixer. Tech Phys Lett. 2010;36(12):1103–5.
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Men’shchikov EM, Gogidze IG, Sergeev AV, Elant’ev AI, Kuminov PB, Gol’tsman GN, et al. Superconducting fast detector based on the nonequilibrium inductance response of a film of niobium nitride. Tech Phys Lett. 1997;23(6):486–8.
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Vakhtomin YB, Finkel MI, Antipov SV, Smirnov KV, Kaurova NS, Drakinskii VN, et al. The gain bandwidth of mixers based on the electron heating effect in an ultrathin NbN film on a Si substrate with a buffer MgO layer. J of communications technol & electronics. 2003;48(6):671–5.
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