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Hübers H-W, Semenov A, Schubert J, Gol'tsman G, Voronov B, Gershenzon E. Performance of the phonon-cooled hot-electron bolometric mixer between 0.7 THz and 5.2 THz. In: Proc. 8-th Int. Conf. on Terahertz Electronics.; 2000. p. 117–9.
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Huebers H-W, Semenov A, Schubert J, Gol’tsman GN, Voronov BM, Gershenzon EM, et al. NbN hot-electron bolometer as THz mixer for SOFIA. In: Melugin RK, Roeser H-P, editors. Proc. SPIE. Vol 4014. SPIE; 2000. p. 195–202.
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Cherednichenko S, Rönnung F, Gol’tsman G, Kollberg E, Winkler D. YBa2Cu3O7-δ hot-electron bolometer mixer at 0.6 THz. In: Proc. 11th Int. Symp. Space Terahertz Technol.; 2000. p. 517–22.
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Cherednichenko S, Kroug M, Yagoubov P, Merkel H, Kollberg E, Yngvesson KS, et al. IF bandwidth of phonon cooled HEB mixers made from NbN films on MgO substrates. In: Proc. 11th Int. Symp. Space Terahertz Technol.; 2000. p. 219–27.
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Yngvesson KS, Gerecht E, Musante CF, Zhuang Y, Ji M, Goyette TM, et al. Low-noise HEB heterodyne receivers and focal plane arrays for the THz regime using NbN. In: Hwu RJ, Wu K, editors. Proc. SPIE. Vol 3795. SPIE; 1999. p. 357–68.
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Cherednichenko S, Ronnung F, Gol'tsman G, Gershenzon E, Winkler D. YBa2Cu3O7-δ hot-electron bolometer with submicron dimensions. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 181–9.
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Schubert J, Semenov A, Gol'tsman G, Hübers H-W, Schwaab G, Voronov B, et al. Noise temperature and sensitivity of a NbN hot-electron mixer at frequencies from 0.7 THz to 5.2 THz. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 190–9.
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Gerecht E, Musante CF, Jian H, Zhuang Y, Yngvesson KS, Dickinson J, et al. Improved characteristics of NbN HEB mixers integrated with log-periodic antennas. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 200–7.
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Yagoubov P, Kroug M, Merkel H, Kollberg E, Hübers H-W, Schubert J, et al. NbN hot electron bolometric mixers at frequencies between 0.7 and 3.1 THz. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 238–46.
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Il'in KS, Gol'tsman GN, Voronov BM, Sobolewski R. Characterization of the electron energy relaxation process in NbN hot-electron devices. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 390–7.
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