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Komrakova, S.; Javadzade, J.; Vorobyov, V.; Bolshedvorskii, S.; Soshenko, V.; Akimov, A.; Kovalyuk, V.; Korneev, A.; Goltsman, G. |
![goto web page (via DOI) doi](https://db.rplab.ru/refbase/img/doi.gif)
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Title |
On-chip controlled placement of nanodiamonds with a nitrogen-vacancy color centers (NV) |
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Conference Article |
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Year |
2018 |
Publication |
J. Phys.: Conf. Ser. |
Abbreviated Journal |
J. Phys.: Conf. Ser. |
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1124 |
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051046 (1 to 4) |
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nanodiamonds, NV-centers |
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Abstract |
Here we studied the fabrication technique of a kilopixel array of nanodiamonds with a nitrogen-vacancy color centers (NV) on top of the chip and measured the second-order correlation function deep, clearly demonstrated the presence of single-photon sources. The controlled position of nanodiamonds, determined from the measurement of second-order correlation fiction, was realize, as well as the yield of optimized technique equals 12.5% is shown. |
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1742-6588 |
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1298 |
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Елманова, А.; Елманов, И.; Комракова, С.; Голиков, А.; Джавадзадэ, Д.; Воробьёв, В.; Большедворский, С.; Сошенко, В.; Акимов, А.; Ковалюк, В.; Гольцман, Г. |
![find record details (via OpenURL) openurl](https://db.rplab.ru/refbase/img/xref.gif)
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Title |
Способ интеграции наноалмазов с нанофотонными устройствами из нитрида кремния |
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Conference Article |
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2019 |
Publication |
Proc. IWQO |
Abbreviated Journal |
Proc. IWQO |
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309-311 |
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Keywords ![sorted by Keywords field, descending order (down)](https://db.rplab.ru/refbase/img/sort_desc.gif) |
nanodiamonds, NV-centers |
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В работе были разработаны оптические структуры из нитрида кремния для дальнейшего размещения на них наноалмазов с NV-центрами, опробованы различные методики нанесения раствора наноалмазов и выбрана оптимальная. Работа имеет практическое значение в области нанофотоники и создании квантово-оптических устройств с однофотонными источниками. |
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Duplicated as 1190 |
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1285 |
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Бурмистрова, А. В.; Девятов, И. А. |
![find record details (via OpenURL) openurl](https://db.rplab.ru/refbase/img/xref.gif)
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Title |
Расчет электронного транспорта в гетероструктурах, содержащих многозонные сверхпроводники |
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Conference Article |
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2014 |
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Труды XVIII международного симпозиума «Нанофизика и наноэлектроника» |
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1 |
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21-22 |
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N/I/Sp junctions |
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В рамках приближения сильной связи теоретически рассчитаны проводимости контактов вида нормальный металл/изолятор/одноорбитальный сверхпроводник с p-типом сверхпроводящего спаривания (N/I/Sp). Объяснено наблюдаемое экспериментально как появление пика при нулевом напряжении, так и его расщепление в зависимости от толщины слоя изолятора. В рамках этой же микроскопической теории развит вариант техники решеточной функции Грина в мацубаровом представлении. Используя разработанный подход, рассчитаны фазовые и температурные зависимости тока Джозефсона для контакта сверхпроводника s-типа и многозонного железосодержащего сверхпроводника (ферропниктида) для различных ориентаций границы по отношению к кристаллографическим осям пниктида. |
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Нижний Новгород, Россия |
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Russian |
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1834 |
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Гершензон, Е. М.; Грачев, С. А.; Литвак-Горская, Л. Б. |
![find record details (via OpenURL) openurl](https://db.rplab.ru/refbase/img/xref.gif)
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Title |
Механизм преобразования частоты в n-InSb-смесителе |
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Journal Article |
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1991 |
Publication |
Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
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25 |
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11 |
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1986-1998 |
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n-InSb mixer |
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Проведено комплексное исследование n-InSb смесителя на λ=2.6 мм, включающее в себя исследование вольт-амперных характеристик при E=0−2 В/см, температурной зависимости проводимости в диапазоне T=1.6−20 K, высокочастотной проводимости при f=0.5−10 МГц и магнитосопротивления при H=0−5 кЭ. Показано, что в оптимальном режиме механизм преобразования частоты связан с фотоионизационными процессами при прыжковой фотопроводимости (ПФП). На основе модели ПФП рассчитан коэффициент преобразования смесителя и произведено сопоставление его с экспериментом. Показана несостоятельность модели преобразования частоты в компенсированном n-InSb (K≥0.8), основанной на разогреве электронов. Обсуждены требования к параметрам материала и режимам n-InSb смесителя миллиметрового диапазона волн. |
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1753 |
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Гершензон, Е. М.; Литвак-Горская, Л. Б.; Луговая, Г. Я.; Шапиро, Е. З. |
![find record details (via OpenURL) openurl](https://db.rplab.ru/refbase/img/xref.gif)
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Title |
Об интерпретации отрицательного магнитосопротивления в случае проводимости по верхней зоне Хаббарда в n-Ge⟨Sb⟩ |
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Journal Article |
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1986 |
Publication |
Физика и техника полупроводников |
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Физика и техника полупроводников |
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20 |
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1 |
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99-103 |
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Keywords ![sorted by Keywords field, descending order (down)](https://db.rplab.ru/refbase/img/sort_desc.gif) |
n-Ge, Hubbard upper zone conductivity, negative magnetoresistance |
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Abstract |
В рамках теории квантовых поправок к проводимости объяснено отрицательное магнитосопротивление в n-Ge с концентрацией доноров Nd≃2.8⋅1016÷1.1⋅1017см−3, наблюдаемое в диапазоне температур 4.2−10 K, когда основной вклад в проводимость дают электроны верхней зоны Хаббарда. Показано, что время релаксации фазы волновой функции τφ определяется временем электрон-фононного взаимодействия τeph. |
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1759 |
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Gershenzon, E. M.; Orlova, S. L.; Orlov, L. A.; Ptitsina, N. G.; Rabinovich, R. I. |
![find record details (via OpenURL) openurl](https://db.rplab.ru/refbase/img/xref.gif)
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Title |
Intervalley cyclotron-impurity resonance of electrons in n-Ge |
Type |
Journal Article |
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1976 |
Publication |
JETP Lett. |
Abbreviated Journal |
JETP Lett. |
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24 |
Issue |
3 |
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125-128 |
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n-Ge, cyclotron-impurity resonance |
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1730 |
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Trifonov, A.; Tong, C.-Y. E.; Grimes, P.; Lobanov, Y.; Kaurova, N.; Blundell, R.; Goltsman, G. |
![goto web page (via DOI) doi](https://db.rplab.ru/refbase/img/doi.gif)
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Title |
Development of a silicon membrane-based multipixel hot electron bolometer receiver |
Type |
Journal Article |
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2017 |
Publication |
IEEE Trans. Appl. Supercond. |
Abbreviated Journal |
IEEE Trans. Appl. Supercond. |
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Volume |
27 |
Issue |
4 |
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1-5 |
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Keywords ![sorted by Keywords field, descending order (down)](https://db.rplab.ru/refbase/img/sort_desc.gif) |
Multi-pixel, NbN HEB, silicon-on-insulator, horn array |
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Abstract |
We report on the development of a multipixel hot electron bolometer (HEB) receiver fabricated using silicon membrane technology. The receiver comprises a 2 × 2 array of four HEB mixers, fabricated on a single chip. The HEB mixer chip is based on a superconducting NbN thin-film deposited on top of the silicon-on-insulator (SOI) substrate. The thicknesses of the device layer and handling layer of the SOI substrate are 20 and 300 μm, respectively. The thickness of the device layer is chosen such that it corresponds to a quarter-wave in silicon at 1.35 THz. The HEB mixer is integrated with a bow-tie antenna structure, in turn designed for coupling to a circular waveguide, fed by a monolithic drilled smooth-walled horn array. |
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1051-8223 |
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1324 |
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Trifonov, A.; Tong, C.-Y. E.; Grimes, P.; Lobanov, Y.; Kaurova, N.; Blundell, R.; Goltsman, G. |
![find record details (via OpenURL) openurl](https://db.rplab.ru/refbase/img/xref.gif)
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Title |
Development of A Silicon Membrane-based Multi-pixel Hot Electron Bolometer Receiver |
Type |
Conference Article |
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2017 |
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IEEE Trans. Appl. Supercond. |
Abbreviated Journal |
IEEE Trans. Appl. Supercond. |
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Volume |
27 |
Issue |
4 |
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6 |
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Multi-pixel, HEB, silicon-on-insulator, horn array |
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Abstract |
We report on the development of a multi-pixel
Hot Electron Bolometer (HEB) receiver fabricated using
silicon membrane technology. The receiver comprises a
2 × 2 array of four HEB mixers, fabricated on a single
chip. The HEB mixer chip is based on a superconducting
NbN thin film deposited on top of the silicon-on-insulator
(SOI) substrate. The thicknesses of the device layer and
handling layer of the SOI substrate are 20 μm and 300 μm
respectively. The thickness of the device layer is chosen
such that it corresponds to a quarter-wave in silicon at
1.35 THz. The HEB mixer is integrated with a bow-tie
antenna structure, in turn designed for coupling to a
circular waveguide, |
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RPLAB @ kovalyuk @ |
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1111 |
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Author |
Zhang, X.; Lita, A. E.; Smirnov, K.; Liu, H. L.; Zhu, D.; Verma, V. B.; Nam, S. W.; Schilling, A. |
![goto web page (via DOI) doi](https://db.rplab.ru/refbase/img/doi.gif)
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Title |
Strong suppression of the resistivity near the superconducting transition in narrow microbridges in external magnetic fields |
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Journal Article |
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2020 |
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Phys. Rev. B |
Abbreviated Journal |
Phys. Rev. B |
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101 |
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6 |
Pages |
060508 (1 to 6) |
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Keywords ![sorted by Keywords field, descending order (down)](https://db.rplab.ru/refbase/img/sort_desc.gif) |
MoSi, WSi films |
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We have investigated a series of superconducting bridges based on homogeneous amorphous WSi and MoSi films, with bridge widths w ranging from 2 to 1000μm and film thicknesses d∼4−6 and 100 nm. Upon decreasing the bridge widths below the respective Pearl lengths, we observe in all cases distinct changes in the characteristics of the resistive transitions to superconductivity. For each of the films, the resistivity curves R(B,T) separate at a well-defined and field-dependent temperature T∗(B) with decreasing the temperature, resulting in a dramatic suppression of the resistivity and a sharpening of the transitions with decreasing bridge width w. The associated excess conductivity in all the bridges scales as 1/w, which may suggest either the presence of a highly conducting region that is dominating the electric transport, or a change in the vortex dynamics in narrow enough bridges. We argue that this effect can only be observed in materials with sufficiently weak vortex pinning. |
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2469-9950 |
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1800 |
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Korneeva, Y. P.; Manova, N. N.; Florya, I. N.; Mikhailov, M. Y.; Dobrovolskiy, O. V.; Korneev, A. A.; Vodolazov, D. Y. |
![goto web page (via DOI) doi](https://db.rplab.ru/refbase/img/doi.gif)
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Title |
Different single-photon response of wide and narrow superconducting MoxSi1−x strips |
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Journal Article |
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2020 |
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Phys. Rev. Applied |
Abbreviated Journal |
Phys. Rev. Applied |
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13 |
Issue |
2 |
Pages |
024011 (1 to 7) |
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MoSi SSPD, SNSPD |
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The photon count rate (PCR) of superconducting single-photon detectors made of MoxSi1−x films shaped as a 2-μm-wide strip and a 115-nm-wide meander strip line is studied experimentally as a function of the dc biasing current at different values of the perpendicular magnetic field. For the wide strip, a crossover current Icross is observed, below which the PCR increases with an increasing magnetic field and above which it decreases. This behavior contrasts with the narrow MoxSi1−x meander, for which no crossover current is observed, thus suggesting different photon-detection mechanisms in the wide and narrow strips. Namely, we argue that in the wide strip the absorbed photon destroys superconductivity locally via the vortex-antivortex mechanism for the emergence of resistance, while in the narrow meander superconductivity is destroyed across the whole strip line, forming a hot belt. Accordingly, the different photon-detection mechanisms associated with vortices and the hot belt determine the qualitative difference in the dependence of the PCR on the magnetic field. |
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1790 |
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