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Kitaeva GK, Kornienko VV, Kuznetsov KA, Pentin IV, Smirnov KV, Vakhtomin YB. Direct detection of the idler THz radiation generated by spontaneous parametric down-conversion. Opt Lett. 2019;44(5):1198–201.
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Vakhtomin YB, Finkel MI, Antipov SV, Smirnov KV, Kaurova NS, Drakinskii VN, et al. The gain bandwidth of mixers based on the electron heating effect in an ultrathin NbN film on a Si substrate with a buffer MgO layer. J of communications technol & electronics. 2003;48(6):671–5.
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Smirnov KV, Ptitsina NG, Vakhtomin YB, Verevkin AA, Gol’tsman GN, Gershenzon EM. Energy relaxation of two-dimensional electrons in the quantum Hall effect regime. JETP Lett. 2000;71(1):31–4.
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Zinoni C, Alloing B, Li LH, Marsili F, Fiore A, Lunghi L, et al. Single-photon experiments at telecommunication wavelengths using nanowire superconducting detectors. Appl Phys Lett. 2007;91(3):031106 (1 to 3).
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Korneev AA, Korneeva YP, Mikhailov MY, Pershin YP, Semenov AV, Vodolazov DY, et al. Characterization of MoSi superconducting single-photon detectors in the magnetic field. IEEE Trans Appl Supercond. 2015;25(3):2200504 (1 to 4).
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Korneeva YP, Mikhailov MY, Pershin YP, Manova NN, Divochiy AV, Vakhtomin YB, et al. Superconducting single-photon detector made of MoSi film. Supercond Sci Technol. 2014;27(9):095012.
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Vorobyov VV, Kazakov AY, Soshenko VV, Korneev AA, Shalaginov MY, Bolshedvorskii SV, et al. Superconducting detector for visible and near-infrared quantum emitters [Invited]. Opt Mater Express. 2017;7(2):513–26.
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Seleznev VA, Divochiy AV, Vakhtomin YB, Morozov PV, Zolotov PI, Vasil'ev DD, et al. Superconducting detector of IR single-photons based on thin WSi films. In: J. Phys.: Conf. Ser. Vol 737.; 2016. 012032.
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Baeva EM, Sidorova MV, Korneev AA, Smirnov KV, Divochy AV, Morozov PV, et al. Thermal properties of NbN single-photon detectors. Phys Rev Applied. 2018;10(6):064063 (1 to 8).
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Zolotov PI, Divochiy AV, Vakhtomin YB, Lubenchenko AV, Morozov PV, Shurkaeva IV, et al. Influence of sputtering parameters on the main characteristics of ultra-thin vanadium nitride films. In: J. Phys.: Conf. Ser. Vol 1124.; 2018. 051030.
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