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Chulcova GM, Ptitsina NG, Gershenzon EM, Gershenzon ME, Sergeev AV. Effect of the interference between electron-phonon and electron-impurity (boundary) scattering on resistivity Nb, Al, Be films. In: Czech J. Phys. Vol 46.; 1996. p. 2489–90.
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Gershenzon EM, Gurvich YA, Orlova SL, Ptitsina NG. Cyclotron resonance of electrons in Ge in a quantizing magnetic field in the case of inelastic scattering by acoustic phonons. Sov Phys JETP. 1975;40(2):311–5.
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Baeva EM, Titova NA, Veyrat L, Sacépé B, Semenov AV, Goltsman GN, et al. Thermal relaxation in metal films limited by diffuson lattice excitations of amorphous substrates. Phys Rev Applied. 2021;15(5):054014.
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Shcherbatenko M, Elezov M, Manova N, Sedykh K, Korneev A, Korneeva Y, et al. Single-pixel camera with a large-area microstrip superconducting single photon detector on a multimode fiber. Appl Phys Lett. 2021;118(18):181103.
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Goltsman GN. Development and applications of terahertz hot electron bolometers [abstract]. In: 1st Moscow Int. Conf. on Submillimeter and Millimeter Astronomy: Objectives and Instruments.; 2021.
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Gershenzon EM, Gurvich YA, Orlova SL, Ptitsina NG. Scattering of electrons by charged impurities in Ge under cyclotron resonance conditions. Presumably: Sov Phys Semicond | Физика и техника полупроводников. 1976;10:1379–83.
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Gershenzon EM, Orlov LA, Ptitsina NG. Absorption spectra in electron transitions between excited states of impurities in germanium. JETP Lett. 1975;22(4):95–7.
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Bondarenko OI, Gershenzon EM, Gurvich YA, Orlova SL, Ptitsina NG. Measurement of the width of the cyclotron resonance line of n-type Ge in quantizing magnetic fields. Presumably: Sov Phys Semicond | Физика и техника полупроводников. 1972;6:362–3.
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Eletskii AV, Sarychev AK, Boginskaya IA, Bocharov GS, Gaiduchenko IA, Egin MS, et al. Amplification of a Raman scattering signal by carbon nanotubes. Dokl Phys. 2018;63(12):496–8.
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Fedorov GE, Stepanova TS, Gazaliev AS, Gaiduchenko IA, Kaurova NS, Voronov BM, et al. Asymmetric devices based on carbon nanotubes for terahertz-range radiation detection. Semicond. 2016;50(12):1600–3.
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