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Beck M, Klammer M, Lang S, Leiderer P, Kabanov VV, Gol'tsman GN, et al. Energy-gap dynamics of superconducting NbN thin films studied by time-resolved terahertz spectroscopy. Phys Rev Lett. 2011;107(17):4.
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Gol'tsman GN, Korneev A, Rubtsova I, Milostnaya I, Chulkova G, Minaeva O, et al. Ultrafast superconducting single-photon detectors for near-infrared-wavelength quantum communications. Phys Stat Sol (C). 2005;2(5):1480–8.
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Peltonen JT, Peng ZH, Korneeva YP, Voronov BM, Korneev AA, Semenov AV, et al. Coherent dynamics and decoherence in a superconducting weak link. Physic Rev B,. 2016;94:180508.
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Aksaev EE, Gershenzon EM, Gol'tsman GN, Mirskij GI, Semenov AD. Submillimetric spectrometer-relaxometer based on backward-wave tubes with picosecond time resolution. Pribory i Tekhnika Eksperimenta. 1991;34(2):125–31.
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Gershenzon EM, Gol'tsman GN, Mirskii GI. Submillimeter backward-wave-tube spectrometer-relaxometer. Pribory i Tekhnika Eksperimenta. 1987;30(4):131–7.
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Gershenzon EM, Gol'tsman GN, Semenov AD. Submillimeter backward wave tube spectrometer for measuring superconducting film transmission. Pribory i Tekhnika Eksperimenta. 1983;26(5):134–7.
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Kaurova NS, Finkel MI, Maslennikov SN, Vahtomin YB, Antipov SV, Smirnov KV, et al. Submillimeter mixer based on YBa2Cu3O7-x thin film. In: Proc. 1-st conf. Fundamental problems of high temperature superconductivity. Moscow-Zvenigorod; 2004. 291.
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Gerecht E, Musante CF, Jian H, Zhuang Y, Yngvesson KS, Dickinson J, et al. Improved characteristics of NbN HEB mixers integrated with log-periodic antennas. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 200–7.
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Il'in KS, Gol'tsman GN, Voronov BM, Sobolewski R. Characterization of the electron energy relaxation process in NbN hot-electron devices. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 390–7.
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Semenov AD, Hübers H–W, Schubert J, Gol'tsman GN, Elantiev AI, Voronov BM, et al. Frequency dependent noise temperature of the lattice cooled hot-electron terahertz mixer. In: Proc. 11th Int. Symp. Space Terahertz Technol.; 2000. p. 39–48.
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