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Gousev YP, Olsson HK, Gol'tsman GN, Voronov BM, Gershenzon EM. NbN hot-electron mixer at radiation frequencies between 0.9 THz and 1.2 THz. In: Proc. 9th Int. Symp. Space Terahertz Technol.; 1998. p. 121–9.
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Il'in KS, Cherednichenko SI, Gol'tsman GN, Currie M, Sobolewski R. Comparative study of the bandwidth of phonon-cooled NbN hot-electron bolometers in submillimeter and optical wavelength ranges. In: Proc. 9th Int. Symp. Space Terahertz Technol.; 1998. p. 323–30.
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Karasik BS, Il'in KS, Ptitsina NG, Gol'tsman GN, Gershenzon EM, Pechen' EV, et al. Electron-phonon scattering rate in impure NbC films [abstract]. In: NASA/ADS.; 1998. Y35.08.
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Gousev YP, Semenov AD, Goghidze IG, Pechen EV, Varlashkin AV, Gol'tsman GN, et al. Current dependent noise in a YBa2Cu3O7-δ hot-electron bolometer. IEEE Trans Appl Supercond. 1997;7(2):3556–9.
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Semenov AD, Gousev YP, Renk KF, Voronov BM, Gol'tsman GN, Gershenzon EM, et al. Noise characteristics of a NbN hot-electron mixer at 2.5 THz. IEEE Trans Appl Supercond. 1997;7(2):3572–5.
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Svechnikov SI, Okunev OV, Yagoubov PA, Gol'tsman GN, Voronov BM, Cherednichenko SI, et al. 2.5 THz NbN hot electron mixer with integrated tapered slot antenna. IEEE Trans Appl Supercond. 1997;7(2):3548–51.
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Zorin M, Milostnaya I, Gol'tsman GN, Gershenzon EM. Fast NbN superconducting switch controlled by optical radiation. IEEE Trans Appl Supercond. 1997;7(2):3734–7.
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Semenov AD, Heusinger MA, Renk KF, Menschikov E, Sergeev AV, Elant'ev AI, et al. Influence of phonon trapping on the performance of NbN kinetic inductance detectors. IEEE Trans Appl Supercond. 1997;7(2):3083–6.
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Gerecht E, Musante CF, Yngvesson KS, Waldman J, Gol'tsman GN, Yagoubov PA, et al. Optical coupling and conversion gain for NbN HEB mixer at THz frequencies. In: Proc. 4-th Int. Semicond. Device Research Symp.; 1997. p. 47–50.
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Verevkin AA, Ptitsina NG, Smirnov KV, Gol'tsman GN, Voronov BM, Gershenzon EM, et al. Hot electron bolometer detectors and mixers based on a superconducting-two-dimensional electron gas-superconductor structure. In: Proc. 4-th Int. Semicond. Device Research Symp.; 1997. p. 163–6.
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