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Meledin D, Tong CY-E, Blundell R, Kaurova N, Smirnov K, Voronov B, et al. Study of the IF bandwidth of NbN HEB mixers based on crystalline quartz substrate with an MgO buffer layer. IEEE Trans Appl Supercond. 2003;13(2):164–7.
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Semenov AD, Hübers H-W, Richter H, Birk M, Krocka M, Mair U, et al. Superconducting hot-electron bolometer mixer for terahertz heterodyne receivers. IEEE Trans. Appl. Supercond.. 2003;13(2):168–71.
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Vachtomin YB, Antipov SV, Maslennikov SN, Smirnov KV, Polyakov SL, Kaurova NS, et al. Noise temperature measurements of NbN phonon-cooled hot electron bolometer mixer at 2.5 and 3.8 THz. In: Proc. 15th Int. Symp. Space Terahertz Technol. Northampton, Massachusetts, USA; 2004. p. 236–41.
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Antipov SV, Vachtomin YB, Maslennikov SN, Smirnov KV, Kaurova NS, Grishina EV, et al. Noise performance of quasioptical ultrathin NbN hot electron bolometer mixer at 2.5 and 3.8 THz. In: Proc. 5-th MSMW. Vol 2. Kharkov, Ukraine; 2004. p. 592–4.
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Baselmans JJA, Hajenius M, Gao JR, Klapwijk TM, de Korte PAJ, Voronov B, et al. Doubling of sensitivity and bandwidth in phonon cooled hot electron bolometer mixers. Appl Phys Lett. 2004;84(11):1958–60.
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Gol'tsman GN, Loudkov DN. Terahertz superconducting hot-electron bolometer mixers and their application in radio astronomy. Radiophys. Quant. Electron.. 2003;46(8/9):604–17.
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Semenov A, Engel A, Il'in K, Gol'tsman G, Siegel M, Hübers H-W. Ultimate performance of a superconducting quantum detector. Eur Phys J Appl Phys. 2003;21(3):171–8.
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Schwaab GW, Sirmain G, Schubert J, Hubers H-W, Gol'tsman G, Cherednichenko S, et al. Investigation of NbN phonon-cooled HEB mixers at 2.5 THz. IEEE Trans Appl Supercond. 1999;9(2):4233–6.
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Meledin D, Pavolotsky A, Desmaris V, Lapkin I, Risacher C, Perez V, et al. A 1.3-THz balanced waveguide HEB mixer for the APEX telescope. IEEE Trans. Microw. Theory Techn.. 2009;57(1):89–98.
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Kawamura J, Blundell R, Tong C-YE, Papa DC, Hunter TR, Paine SN, et al. Superconductive hot-electron-bolometer mixer receiver for 800-GHz operation. IEEE Trans Microw Theory Techn. 2000;48(4):683–9.
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