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Gershenzon EM, Gol'tsman GN, Ptitsina NG, Riger ER. Effect of electron-electron collisions on the trapping of free carriers by shallow impurity centers in germanium. Sov Phys JETP. 1986;64(4):889–97.
Abstract: Cascade Auger recombination of free carriers on shallow impurities in Ge is investigated under quasi-equilibrium conditions (T= 2-12 K) and in impurity breakdown. The Auger capture cross sections are found to be a,= 5. 10-l9 T-'n cm2 for donors and uip= 7- T-5p cm2 for acceptors. It is shown that in an isotropic semiconductor (p-Ge) ui is well described by the cascade-capture theory that takes into account only electron-electron collisions. In an anisotropic semiconductor ui is considerably larger (n-Ge, strongly uniaxially compressedp-Ge). Under impurity breakdown conditions the electron-electron collisions determine the lifetimes of the free carriers only in samples with appreciable density of the compensating impurity (Nk loi3 cmP3).
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Gershenzon EM, Gol'tsman GN, Ptitsina NG. Observation of the free-exciton spectrum at submillimeter wavelengths. JETP Lett. 1972;16(4):161–2.
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Gershenson EM, Gol'tsman GN, Elant'ev AI, Kagane ML, Multanovskii VV, Ptitsina NG. Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. Sov Phys Semicond. 1983;17(8):908–13.
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Gershenzon EM, Goltsman GN, Multanovskii VV, Ptitsina NG. Kinetics of submillimeter impurity and exciton photoconduction in Ge. Optics and Spectroscopy. 1982;52(4):454–5.
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Gershenzon EM, Gol'tsman GN, Multanovskii VV, Ptitsina NG. Cross section for binding of free carriers into excitons in germanium. JETP Lett. 1981;33(11):574.
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Gershenzon EM, Gol'tsman GN, Ptitsina NG. Population and lifetime of excited states of shallow impurities in Ge. Sov Phys JETP. 1979;49(2):355–62.
Abstract: An investigation was made of the dependences of the intensities of photothermal ionization lines of excited states of shallow impurities in Ge on the intensity of impurity-absorbed background radiation and on temperature. The results obtained were used to find the density and lifetime of carriers of lower excited states of the impurity centers. The lifetimes of the excited states of donors in Ge were 10-~-10-" sec and the lifetime of the lower excited state of acceptors was -lo-' sec. In the presence of background radiation the population of the excited states was very different from the equilibrium value and, in particular, a population inversion of the 2pk, state relative to the 3p0 and 3s states was observed.
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Gershenzon EM, Orlova SL, Orlov LA, Ptitsina NG, Rabinovich RI. Intervalley cyclotron-impurity resonance of electrons in n-Ge. JETP Lett. 1976;24(3):125–8.
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Gershenzon EM, Gol'tsman GN, Ptitsina NG. Investigation of free excitons in Ge and their condensation at submillimeter wavelengths. Sov Phys JETP. 1976;43(1):116–22.
Abstract: Results are presented of an investigation of free excitons in Ge in the submillimeter wavelength range for low as well as for high excitation levels when interaction between the excitons becomes important. The free-exciton energy spectrum is discussed. It is shown that the drop radii and their concentrations can be determined by measuring the temperature dependence of the free-exciton concentration. A section of the phase diagram is obtained in the 0.5-2.8 K temperature range for the free excitons+condensate system.
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Gershenzon EM, Gol'tsman G, Ptitsina NG. Energy spectrum of free excitons in germanium. JETP Lett. 1973;18(3):93.
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Gershenzon EM, Gol'tsman GN, Ptitsina NG. Submillimeter spectroscopy of semiconductors. Sov Phys JETP. 1973;37(2):299–304.
Abstract: The possibility is considered of carrying out submillimeter-wave spectral investigations of semiconductors by means of a high resolution spectrometer with backward-wave tubes. Results of a study of the excitation spectra of small impurities, D-(A +) centers and free excitons in germanium are presented.
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