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0kunev 0., Dzardanov A, Ekstrom H, Jacobsson S, Kollberg E, Gol'tsman G, et al. NbN hot electron waveguide mixer for 100 GHz operation. In: Proc. 5th Int. Symp. Space Terahertz Technol.; 1994. p. 214–24.
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Gousev YP, Semenov AD, Gol'tsman GN, Sergeev AV, Gershenzon EM. Electron-phonon interaction in disordered NbN films. Phys B Condens Mat. 1994;194-196:1355–6.
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Gol’tsman GN, Gershenzon EM. High speed hot-electron superconducting bolometer. In: Birch JR, Parker TJ, editors. Proc. SPIE. Vol 2104. SPIE; 1993. p. 181–2.
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Voronov BM, Gershenzon EM, Gol'tsman GN, Gogidze IG, Gusev YP, Zorin MA, et al. Picosecond range detector base on superconducting niobium nitride film sensitive to radiation in spectral range from millimeter waves up to visible light. Sverkhprovodimost': Fizika, Khimiya, Tekhnika. 1992;5(5):955–60.
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Budyanskij MY, Sejdman LA, Voronov BM, Gubkina TO. Increase of reproducibility in production of superconducting thin films of niobium nitride. Sverkhprovodimost': Fizika, Khimiya, Tekhnika. 1992;5(10):1950–4.
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Gol’tsman GN. Overview of recent results for superconducting NbN terahertz and optical detectors and mixers.; 2014.
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Pentin I, Finkel M, Maslennikov S, Vakhtomin Y, Smirnov K, Kaurova N, et al. Superconducting hot-electron-bolometer mixers for the mid-IR. Rus J Radio Electron [Internet]. 2017 [cited 2024 Jul 15];(10):http://jre.cplire.ru/jre/oct17/9/text.pdf. Available from: http://jre.cplire.ru/jre/oct17/9/abstract_e.html
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Zhang J, Verevkin A, Slysz W, Chulkova G, Korneev A, Lipatov A, et al. Time-resolved characterization of NbN superconducting single-photon optical detectors. In: Armitage JC, editor. Proc. SPIE. Vol 10313. SPIE; 2017. 103130F (1 to 3).
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Verevkin A, Zhang J, Pearlman A, Slysz W, Sobolewski R, Korneev A, et al. Ultimate sensitivity of superconducting single-photon detectors in the visible to infrared range.; 2004.
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Baeva EM, Titova NA, Veyrat L, Sacépé B, Semenov AV, Goltsman GN, et al. Thermal relaxation in metal films limited by diffuson lattice excitations of amorphous substrates. Phys Rev Applied. 2021;15(5):054014.
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