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Gerecht E, Musante CF, Wang Z, Yngvesson KS, Mueller ER, Waldman J, et al. Optimization of hot eleciron bolometer mixing efficiency in NbN at 119 micrometer wavelength. In: Proc. 7th Int. Symp. Space Terahertz Technol.; 1996. p. 584–600.
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Semenov A, Richter H, Hübers H-W, Petrenko D, Tretyakov I, Ryabchun S, et al. Optimization of the intermediate frequency bandwidth in the THz HEB mixers [abstract]. In: Proc. 25th Int. Symp. Space Terahertz Technol.; 2014. 54.
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Hajenius M, Yang ZQ, Gao JR, Baselmans JJA, Klapwijk TM, Voronov B, et al. Optimized sensitivity of NbN hot electron bolometer mixers by annealing. IEEE Trans Appl Supercond. 2007;17(2):399–402.
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Tret’yakov IV, Ryabchun SA, Kaurova NS, Larionov PA, Lobastova AA, Voronov BM, et al. Optimum absorbed heterodyne power for superconducting NbN hot-electron bolometer mixer. Tech Phys Lett. 2010;36(12):1103–5.
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Ynvesson KS, Kollberg EL. Optimum receiver noise temperature for NbN HEB mixers according to standard model. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 566–82.
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Hübers H-W, Schubert J, Krabbe A, Birk M, Wagner G, Semenov A, et al. Parylene anti-reflection coating of a quasi-optical hot-electron-bolometric mixer at terahertz frequencies. Infrared Physics & Technology. 2001;42(1):41–7.
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Kawamura J, Blundell R, Tong C‐yu E, Gol’tsman G, Gershenzon E, Voronov B. Performance of NbN lattice‐cooled hot‐electron bolometric mixers. J Appl Phys. 1996;80(7):4232–4.
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Yagoubov P, Kroug M, Merkel H, Kollberg E, Schubert J, Hubers H-W, et al. Performance of NbN phonon-cooled hot-electron bolometric mixer at Terahertz frequencies. In: Proc. 6-th Int. Conf. Terahertz Electron.; 1998. p. 149–52.
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de Lange G, Krieg J-M, Honingh N, Karpov A, Cherednichenko S. Performance of the HIFI flight mixers. In: Proc. 19th Int. Symp. Space Terahertz Technol.; 2008. p. 98–105.
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Hübers H-W, Semenov A, Schubert J, Gol'tsman G, Voronov B, Gershenzon E. Performance of the phonon-cooled hot-electron bolometric mixer between 0.7 THz and 5.2 THz. In: Proc. 8-th Int. Conf. on Terahertz Electronics.; 2000. p. 117–9.
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